X射线衍射方法分析粗晶铁硅合金的残余应力
Analysis of Residual Stress in Coarse-Grained Fe-Si Alloy by X-Ray Diffraction
摘 要
尝试采用Imura等提出的单晶材料残余应力的测量方法来分析拉伸不同程度后粗晶铁硅合金的残余应力, 先利用衍射仪测得试样衍射峰的位置后, 再根据晶面指数和Imura方法计算出残余应力的大小。结果表明: 该方法可以用于粗晶材料残余应力的测定; 随着拉伸变形量的增大, 各个衍射晶面的半高宽随之增大; 当晶面位置参数精度为0.25°、衍射角精度为0.01°时, 计算的应力状态基本符合试样拉伸后应力状态的理论值。
残余应力
Imura方法
铁硅合金
X-ray diffraction
residual stress
Imura method
Fe-Si alloy
Abstract
Residual stress in coarse-grained Fe-Si alloy with different tensile deformations were analyzed by a method proposed by Imura for measuring residual stress in single crystal material. Firstly, the diffraction peak positions were found using the diffract-meter, and then the residual stress was calculated according to the plane index and the method of Imura. The results show that the method could be used for the determination of residual stress in this material. With the increase of deformation degree, the full width at half maximum (FWHM) of each diffracted plane increased. When the accuracy of position parameters was 0.25° and the accuracy of diffraction angle was 0.01°, the calculated results were in line with the theoretical value of the tensile stress state.
中图分类号 TG115.22
所属栏目 残余应力
基金项目
收稿日期 2013/3/22
修改稿日期 2013/10/1
网络出版日期
作者单位点击查看
备注万鑫(1988-), 男, 河南驻马店人, 硕士研究生。
引用该论文: WAN Xin,ZHAN Ke,JIANG Chuan-hai. Analysis of Residual Stress in Coarse-Grained Fe-Si Alloy by X-Ray Diffraction[J]. Materials for mechancial engineering, 2014, 38(6): 95～99
万鑫,詹科,姜传海. X射线衍射方法分析粗晶铁硅合金的残余应力[J]. 机械工程材料, 2014, 38(6): 95～99
被引情况:
【1】邢万强,熊良山,汤祁,尹凯, "硬车削300M钢表面的残余主应力",机械工程材料 40, 40-42(2016)
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参考文献
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【6】鞠明, 黄坚, 吴毅雄. X射线衍射法测AM1镍基单晶合金的残余应力［J］.机械工程材料,2013, 37(3):99-103.
【2】陈艳华, 须庆, 姜传海, 等.单晶材料X射线应力测定原理与方法［J］.理化检验-物理分册,2012,48(3):144-147.
【3】IMURA T, WEISSMANN S, SLADE J J. A study of age-hardening of Al-3.85% Cu by the divergent X-ray beam method［J］.Acta Crystallographica,1962,15(8):786-793.
【4】SAKATA K, DANIEL D, JONAS J J. Estimation of 8th, 10th and 12th order ODF coefficients from elastic properties in cold rolled steel sheets by adjustment of single crystal［J］.Textures and Microstructures,1990,12:175-185.
【5】HUANG W J. Contribution à l′analyse par diffractomètre X des déformations et des contraintes à l’échelle des grains［D］.Paris: Ecole Nationale Superieure d′Arts et Metiers (ENSAM),2007: 18-52.
【6】鞠明, 黄坚, 吴毅雄. X射线衍射法测AM1镍基单晶合金的残余应力［J］.机械工程材料,2013, 37(3):99-103.
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