ICP MS Determination of 15 Impurity Elements in High Purity Vanadium Pentoxide with Microwave Assisted Sample Digestion
摘 要
高纯五氧化二钒样品在硝酸氢氟酸(4+1)混合液中经微波消解处理,采用电感耦合等离子体质谱法测定样品溶液中15种杂质元素(钛、硅、铝、铬、镍、铜、铅、砷、磷、铁、锰、钙、镁、钾、钠)的含量。采用内标法消除基体的影响。方法的检出限(3s/k)在0.03~0.89 μg·L-1之间。方法的加标回收率在90.0%~113%之间,相对标准偏差(n=8)小于5.0%。五氧化二钒5号样品中8种杂质元素的测定值与石墨炉原子吸收光谱法进行核对,测得结果互相符合。
Abstract
The sample of vanadium pentoxide was treated with a mixture of HNO3 and HF (4+1) by microwave assisted digestion, and contents of 15 impurity elements ( i.e. Ti, Si, Al, Cr, Ni, Cu, Pb, As, P, Fe, Mn, Ca, Mg, K and Na ) in the sample solution were determined by ICPMS. The matrix interference was eliminated by internal standard method. Detection limits (3s/k) of the method found were in the range of 0.03-0.89 μg·L-1. Tests for recovery were made by standard addition method, giving values of recovery in the range of 90.0%-113% and RSD′s (n=8) found were less than 5.0%. Contents of 8 impurity elements in sample 5# were checked by GFAAS method, consistent values were obtained.
中图分类号 O657.63
所属栏目 工作简报
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收稿日期 2013/5/17
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备注成勇(1968-),男,四川泸州人,高级工程师,主要研究方向为原子光谱各质谱分析方法的研究及应用。
引用该论文: CHENG Yong. ICP MS Determination of 15 Impurity Elements in High Purity Vanadium Pentoxide with Microwave Assisted Sample Digestion[J]. Physical Testing and Chemical Analysis part B:Chemical Analysis, 2014, 50(6): 745~748
成勇. 微波消解-电感耦合等离子体质谱法测定高纯五氧化二钒中15种杂质元素[J]. 理化检验-化学分册, 2014, 50(6): 745~748
被引情况:
【1】文田耀, "电感耦合等离子体质谱法测定重晶石中的微量元素",理化检验-化学分册 52, 672-676(2016)
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参考文献
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【2】KINGSTON H M, JASSIE L B. Introduction to microwave sample preparation: theory and practice[M]. New York: American Chemical Society, 1988.
【3】成勇.微波密闭消解ICPMS测定高纯金属硅中痕量杂质元素硼[J].理化检验化学分册, 2012,48(3):328-331.
【4】王小如.电感耦合等离子体质谱应用实例[M].北京:化学工业出版社, 2005.
【5】胡净宇,王海舟.电感耦合等离子体质谱干扰对钢铁及合金痕量分析的影响[J].冶金分析, 2007,27(3):18-24.
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