Line Profile Analysis of Diffraction Line Broaden and Characterization of Microstructure
摘 要
引起衍射线条宽化的不仅是微晶和第II类(微观)应力, 还有层错/孪生和位错。围绕着如何分离这种多(二、三乃至四)重宽化效应和如何求解微晶尺度、微观应变(力)、层错几率、层错密度和位错分布参数等, 发展了一系列线形分析方法。从线形卷积关系、微晶-微应变宽化线形分析、微晶-微应力-层错宽化线形分析和微晶-层错-位错宽化线形分析共4个部分介绍了线形分析技术的发展和应用, 以及笔者近十年进行的某些研究工作。
Abstract
Lead to diffraction line broaden do not only have the crystallite and microcosmic stress but also have stacking faults/twins and dislocation. Round how separating many (two, three) fold broaden effects and how solving crystallite size, microstress, fault probability, dislocation density and dislocation distribution parameters, several methods of line profile analysis were developed. The advances and applications of line analysis techniques were introduced, and some works of authors in near ten years were introduced yet, from four parts including convolute relationships of line profiles and line broads, analysis techniques of crystallite-microstress two-fold effect, the least square method separating crystallite-microstress-fault and crystallite-fault-dislocation three-hold effects.
中图分类号 TG115.23
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收稿日期 2013/12/2
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备注杨传铮(1939-),男, 教授。
引用该论文: YANG Chuan-zheng,JIANG Chuan-hai. Line Profile Analysis of Diffraction Line Broaden and Characterization of Microstructure[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2014, 50(9): 658~667
杨传铮,姜传海. 衍射线宽化的线形分析和微结构表征[J]. 理化检验-物理分册, 2014, 50(9): 658~667
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参考文献
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【5】Materials Data Inc. Jade 7.0 XRD Pattern Processing[M].USA: Materials Data Inc, 2004.
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【7】杨传铮, 张建. X射线衍射研究纳米材料微结构的一些进展[J].物理学进展, 2008, 28(3): 280-313.
【8】LANGFORD J I, BOUITIF A. The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in Ex-oxalate zinc oxide[J].J Appl Cryst, 1993, 26(1): 22-32.
【9】LOU Yu-wan, YANG Chuan-zheng, MA Li-ping, et al. Comparative study on microstructure of β-Ni(OH)2 as cathode material for Ni-MH battery[J].Science in China, ser. E: Technological Science, 2006, 49(3):297-312.
【10】娄豫皖, 杨传铮, 马丽萍, 等. MH-Ni电池中正极材料β-Ni(OH)2微结构的对比研究[J].中国科学 E辑 技术科学, 2006, 36(5): 467-482.
【11】程利芳, 杨传铮, 蒲朝辉, 等. 面心立方纳米材料中微结构的X射线衍射表征[J].科学研究月刊, 2008, 8(8): 54-57.
【12】杨传铮, 蒲朝辉, 李志林. 纳米镍粉的制备和微结构的X射线衍研究[J].纳米科技, 2009,6(2): 2-7.
【13】PU Zhao-hui, YANG Chuan-zheng, CHEN Li-fang, et al. X-ray diffraction characterization and study of the microstructure in hexagonal close-packed nano material[J].Powder Diffraction, 2008, 23(3): 213-223.
【14】李辉,杨传铮,刘芳.测定六方石墨堆垛无序度的X射线衍射研究新方法[J].中国科学 B辑 化学, 2008,38(9): 755-850.
【15】李辉,杨传铮,刘芳.碳电极材料石墨化度和堆垛无序度的X射线衍射研究[J].分析技术学报,2008,23(2): 161-167.
【2】KLUG H P, ALEXANDER L E. X-ray Diffraction Procedure for Polycrystalline and Amorphous Materials[M].New York: Wiley-Interscience, 1974.
【3】王英华. X光衍射技术基础[M].北京: 原子能出版社, 1987.
【4】邱利, 胡王和. X射线衍射技术及设备[M].北京: 冶金工业出版社, 1998.
【5】Materials Data Inc. Jade 7.0 XRD Pattern Processing[M].USA: Materials Data Inc, 2004.
【6】钦佩,娄豫皖, 杨传铮, 等. 分离X射线衍射线多重宽化效应的新方法和计算程序[J].物理学报, 2006, 55(3): 1325-1335.
【7】杨传铮, 张建. X射线衍射研究纳米材料微结构的一些进展[J].物理学进展, 2008, 28(3): 280-313.
【8】LANGFORD J I, BOUITIF A. The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in Ex-oxalate zinc oxide[J].J Appl Cryst, 1993, 26(1): 22-32.
【9】LOU Yu-wan, YANG Chuan-zheng, MA Li-ping, et al. Comparative study on microstructure of β-Ni(OH)2 as cathode material for Ni-MH battery[J].Science in China, ser. E: Technological Science, 2006, 49(3):297-312.
【10】娄豫皖, 杨传铮, 马丽萍, 等. MH-Ni电池中正极材料β-Ni(OH)2微结构的对比研究[J].中国科学 E辑 技术科学, 2006, 36(5): 467-482.
【11】程利芳, 杨传铮, 蒲朝辉, 等. 面心立方纳米材料中微结构的X射线衍射表征[J].科学研究月刊, 2008, 8(8): 54-57.
【12】杨传铮, 蒲朝辉, 李志林. 纳米镍粉的制备和微结构的X射线衍研究[J].纳米科技, 2009,6(2): 2-7.
【13】PU Zhao-hui, YANG Chuan-zheng, CHEN Li-fang, et al. X-ray diffraction characterization and study of the microstructure in hexagonal close-packed nano material[J].Powder Diffraction, 2008, 23(3): 213-223.
【14】李辉,杨传铮,刘芳.测定六方石墨堆垛无序度的X射线衍射研究新方法[J].中国科学 B辑 化学, 2008,38(9): 755-850.
【15】李辉,杨传铮,刘芳.碳电极材料石墨化度和堆垛无序度的X射线衍射研究[J].分析技术学报,2008,23(2): 161-167.
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