XRFS Determination of Lead and Cadmium in Polymeric Materials
摘 要
提出了X射线荧光光谱法测定聚合物材料中铅和镉的方法。将粒径小于4 mm的样品颗粒置于样品杯中,保持样品厚度大于16 mm,加盖后按仪器工作条件进行测定。铅和镉的线性范围依次在1 033 μg·g-1和980 μg·g-1以内,检出限依次为0.31 μg·g-1和0.69 μg·g-1。方法用于分析标准物质(ERM-EC680k和ERM-EC681k),测定值与认定值相符。
Abstract
XRFS determination of lead and cadmium in polymeric materials was proposed in this paper. The sample was crusned to granules having granular diameters less than 4 mm and transferred into the sample cup, packing the sample granules to a thickness over 16 mm. After covering the sample cup, XRFS determination was performed according to the prescribed instrumental working condition. Linearity ranges of Pb and Cd were kept in the range within 1 033 μg· g-1 and 980 μg· g-1, with detection limits of 0.31 μg· g-1 and 0.69 μg· g-1 respectively. The proposed method was used in analyzing two standard reference materials (ERM-EC681k and ERM-EC680k), giving results in consistency with the certified values.
中图分类号 O657.34
所属栏目 工作简报
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收稿日期 2011/5/20
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联系人作者王斌(abin230@163.com)
备注王斌(1981-),男,辽宁沈阳人,工程师,硕士研究生,研究方向为无机元素检测。
引用该论文: WANG Bin,ZHANG Hua,HUANG Wei,FENG Xiao-jun,LIU Ji-ping. XRFS Determination of Lead and Cadmium in Polymeric Materials[J]. Physical Testing and Chemical Analysis part B:Chemical Analysis, 2012, 48(7): 810~811
王斌,张华,黄伟,冯小军,刘继平. X射线荧光光谱法测定聚合物材料中铅和镉[J]. 理化检验-化学分册, 2012, 48(7): 810~811
被引情况:
【1】王斌,张江锋,蒋小良,黄伟,钟康华, "X射线荧光光谱法测定皮革及其制品中的铅",理化检验-化学分册 51, 869-871(2015)
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参考文献
【1】CPSIA H R 4040Consumer product safety improvement act of 2008[S].
【2】91/338/EECTotal cadmium content test-european directive[S].
【3】2002/95/ECRestriction of the use of certain hazardous substances in electrical and electronic equipment[S].
【4】宋武元,郑建国,肖前,等.X射线荧光光谱法同时测定电子电气产品中限制使用物质铅、汞、镉、铬和溴[J].光谱学与光谱分析, 2006,26(12):2350-2353.
【5】曾小平,宋武元,吴冰.X射线荧光光谱法同时测定锰锌铁氧体材料的主量组分[J].理化检验-化学分册, 2010,46(8):940-942.
【2】91/338/EECTotal cadmium content test-european directive[S].
【3】2002/95/ECRestriction of the use of certain hazardous substances in electrical and electronic equipment[S].
【4】宋武元,郑建国,肖前,等.X射线荧光光谱法同时测定电子电气产品中限制使用物质铅、汞、镉、铬和溴[J].光谱学与光谱分析, 2006,26(12):2350-2353.
【5】曾小平,宋武元,吴冰.X射线荧光光谱法同时测定锰锌铁氧体材料的主量组分[J].理化检验-化学分册, 2010,46(8):940-942.
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