熔融制样-X射线荧光光谱法测定锰铁中硅、锰、磷、铬、镍和铜
XRFS Determination of Silicon,Manganese,Phosphorus,Chromium,Nickel and Copper in Ferromanganese with Sample Preparation by Fusion
摘 要
采用熔融制样-X射线荧光光谱法测定锰铁中硅、锰、磷、铬、镍和铜的含量.样品以四硼酸锂为熔剂,在300 ℃下加热15 min,慢速升温至1 100 ℃,熔融15 min,冷却后制成玻璃片,用于X射线荧光光谱分析.6种元素在一定的质量分数范围内与其信号强度呈线性关系,方法的检出限在15~59 μg·g-1之间.方法用于锰铁样品的分析,测定值的相对标准偏差(n=11)在0.16%~3.6%之间.
熔融制样
锰铁
XRFS
Sample preparation by fusion
Ferromanganese
Abstract
XRFS was applied to the determination of silicon,manganese,phosphorus,chromium,nickel and copper in ferromanganese.Using Li2B4O7 as flux,the sample was first heated at 300 ℃ for 15 min,and then the temperature was gradually raised to 1 100 ℃,where the sample was fused for 15 min.After cooling,the glassy melt obtained was used directly as sample for XRFS analysis.Linear relationships between values of signal intensity and mass fraction of the 6 elements were kept in definite ranges.Detection limits found were ranged from 15 to 59 μg·g-1.The proposed method was applied to the analysis of substantial ferromanganese sample,giving values of RSD′s (n=11) in the ranges of 0.16%-3.6%.
中图分类号 O657.34 DOI 10.11973/lhjy-hx201508016
所属栏目 工作简报
基金项目
收稿日期 2015/1/10
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备注张秀芳(1962-),女,上海人,工程师,研究方向为焊接产品及原副材料的化学分析.
引用该论文: ZHANG Xiu-fang,LU Xiao-ming. XRFS Determination of Silicon,Manganese,Phosphorus,Chromium,Nickel and Copper in Ferromanganese with Sample Preparation by Fusion[J]. Physical Testing and Chemical Analysis part B:Chemical Analysis, 2015, 51(8): 1110～1112
张秀芳,陆晓明. 熔融制样-X射线荧光光谱法测定锰铁中硅、锰、磷、铬、镍和铜[J]. 理化检验－化学分册, 2015, 51(8): 1110～1112
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参考文献
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【5】候艳水,赵伟,王国增.X荧光熔片法测定硅铝铁、硅铝钡铁中硅铝[J].冶金分析,2004,24(增):228-229．
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【11】普旭力,蔡继杰,王伟,等.熔融制样-X射线荧光光谱法测定镧铈镨钕稀土合金[J].冶金分析,2015,35(1):34-37．
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