Displacement Measurement of Chip Solder Ball Under Uniform Thermal Load by DIC
摘 要
采用数字图像相关法成功得到了芯片焊点(尺寸为 0.8 mm)在均匀热载荷下的面内位移变形场的数字化结果。检测系统结合了长距离显微观测及图像采集系统、可控制加热恒温系统及照明系统等硬件,使数字图像相关测试进入到细观研究领域。在进行芯片焊点表面位移场的定量测量的同时,利用相同边界条件的有限元方法进行模拟计算,以进行结果的比较,两者吻合较好。试验结果证明了数字图像相关方法及设计的检测系统在微变形场测量上的准确性和稳定性。
Abstract
The digital result of surface displacement deformation field under uniform thermal load of chip solder joint (no more than 0.8 mm) was successfully got by digital image correlation method. The system combined the long distance microscopic observation and image acquisition system, thermostats controllable heating and lighting systems and other hardwares, and it made the digital image correlation method possible to proceed research in micro field. At the same time, finite element method was simulated with the same boundary conditions and the caculated results showed that datas obtained by the two methods were in good agreement. Testing results showed that the digital image correlation method and the designed testing system was in good accuracy and stability in micro deformation measurement.
中图分类号 TG115.28
所属栏目 科研成果与学术交流
基金项目 国家自然科学基金资助项目(10102011)
收稿日期 2006/8/31
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备注陆 鹏(1977-),男,博士研究生,主要从事光学无损检测及有限元研究。
引用该论文: LU Peng,ZHANG Xi. Displacement Measurement of Chip Solder Ball Under Uniform Thermal Load by DIC[J]. Nondestructive Testing, 2007, 29(11): 634~636
陆 鹏,张 熹. 数字图像相关法测量芯片焊点在均匀热载荷下的变形[J]. 无损检测, 2007, 29(11): 634~636
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参考文献
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【2】邹大庆,谢惠民,刑永明,等.微电子封装组件热应变的云纹干涉法研究[J].实验力学,2002,17(增刊):157.
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