Progress in Techniques and Equipment of Specimen Preparation of Materials for Microstructural Analysis
摘 要
简要介绍了材料显微试样的先进制备技术和使用设备(包括耗材)的进展,特别强调了新型制备表面、金刚石和非晶态胶体状二氧化硅磨料在磨光和抛光过程中所起的重要作用。
Abstract
Progress in the techniques and equipment (including consumables) of specimen preparation of materials for microstructural analysis was reviewed briefly. Special emphasis was given to the important role played by the newly developed preparation surfaces, diamond abrasives and amorphous colloidal silica.
中图分类号 TG115.21+1.2
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收稿日期 2009/9/6
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备注谢希文(1929-),男,教授。
引用该论文: XIE Xi-wen. Progress in Techniques and Equipment of Specimen Preparation of Materials for Microstructural Analysis[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2010, 46(5): 296~302
谢希文. 材料显微组织分析试样制备技术和设备的进展[J]. 理化检验-物理分册, 2010, 46(5): 296~302
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参考文献
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【2】MLLER G, KOPP W-U. Methodical metallographic preparation[J]. Practical Metallography, 1989,26(12): 640-653.
【3】BJERREGAARD L, GEELS K, OTTESEN B, et al. Metalog GuideTM[M]. Danmark: Struers A/S,1996: ISBN 87-982864-2-0.
【4】BUEHLER. SUM-METTM-The Science Behind Materials Preparation[M]. Copyright. USA: Buehler Ltd, 2007: ISBN 0-9752898-0-2.
【5】BUTTITTA S, DOUGILL N. Orbital technology -the science of the cut[J]. TECH-NOTES, 2000 Buehler Ltd, 2000,3(4):1-6.
【2】MLLER G, KOPP W-U. Methodical metallographic preparation[J]. Practical Metallography, 1989,26(12): 640-653.
【3】BJERREGAARD L, GEELS K, OTTESEN B, et al. Metalog GuideTM[M]. Danmark: Struers A/S,1996: ISBN 87-982864-2-0.
【4】BUEHLER. SUM-METTM-The Science Behind Materials Preparation[M]. Copyright. USA: Buehler Ltd, 2007: ISBN 0-9752898-0-2.
【5】BUTTITTA S, DOUGILL N. Orbital technology -the science of the cut[J]. TECH-NOTES, 2000 Buehler Ltd, 2000,3(4):1-6.
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