J75不锈钢淬火应力的X射线衍射分析
Stress Analysis of J75 Stainless Steel Aftrer Quenching by X-ray Diffraction
摘 要
利用铬靶X射线在侧倾结合固定ψ法基础上对J75不锈钢的(311)面进行了淬火应力测量,得到了不同淬火温度下J75合金试样中心点的残余应力值和近表面微应变效应。结果表明：试样表面残余压应力值在-400~-650 MPa,最大值出现在淬火温度为700℃左右;淬火使衍射峰半高宽由1.25°增加至1.4°以上,显著增加了J75合金的位错等缺陷。受淬火瞬时热应力分布影响,越靠近试样表面衍射峰的宽化越严重。
X射线衍射
残余应力
J75 stainless steel
X-ray diffraction
residual stress
diffraction line broadening
Abstract
Based on the side tilt and fix ψ method,the (311) plane of quenched J75 stainless steel was measured by X-ray diffraction. The residual stress and micro-strain effects of J75 stainless steel surface center in different quenching temperatures were determined. The measurement results showed that the compressed residual stress in the sample surface was between -400 MPa and -650 MPa,the maximal value appeared when quenching temperature was about 700℃. The quenching also causeed the increase of FWHM of diffraction peaks from 1.25°to above 1.4°,so a lot of dislocations and other defect developed and according to the instantaneous heat stress distribution,the nearer the surface was,the larger the diffraction line broadening was.
中图分类号 TG115.22+2.2
所属栏目 试验技术与方法
基金项目
收稿日期 2007/12/5
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备注孙光爱(1980-),男,助理研究员,博士研究生。
引用该论文: SUN Guang-ai,CHEN Bo,WU Er-dong,LI Xiu-yan. Stress Analysis of J75 Stainless Steel Aftrer Quenching by X-ray Diffraction[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2009, 45(2): 89～93
孙光爱,陈波,吴二冬,李秀艳. J75不锈钢淬火应力的X射线衍射分析[J]. 理化检验－物理分册, 2009, 45(2): 89～93
被引情况:
【1】王颖,胡小军,张荣,李丽敏, "X射线衍射法测试轧板表面残余应力",理化检验－物理分册 48, 302-305(2012)
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参考文献
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【2】汤光平,黄文荣,关 垲,等. 表面改性对抗氢钢吸氢和抗氢性能的影响[J]. 材料保护,2000,33(6) ：48-50．
【3】Thompson A W,Brooks J A. Hydrogen performance of precipitation-strengthened stainless steels based on A-286 [J]. Met Trans,1975,6A: 1431-1442．
【4】孙光爱,陈 波,杜红林. R(Fe,Mo)12型稀土永磁材料热膨胀反常现象研究[J]. 物理学报,2005,54(9)： 4240-4244．
【5】孔德军,张永康,陈志刚,等. 基于XRD的镀锌钝化膜残余应力试验研究[J]. 物理学报,2007,56(7)： 4056-4061．
【6】张定铨,何家文. 材料中残余应力的X射线衍射分析和作用[M]. 西安：西安交通大学出版社,1999:16,102．
【7】徐寒冰,宋小平,盖秀颖,等. X射线应力测定中的交相关定峰法的改进[J]. 材料研究学报,2000,14： 13-18．
【8】Yoshimoto T,Ishihara S,Goshima T,et al. An improved method for the determination of the maximum thermal stress induced during a quench test [J]. Scripta Mater,1999,41(5): 553-559．
【9】Davor B,Hassel L. Voigt-function modeling in fourier analysis of size and strain broadened X-ray diffraction peaks [J]. J Appl Cryst,1993,26: 97-103．
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