利用模拟衍射线计算X射线应力测定中的误差
ON THE ERRORS FORMULA FOR X-RAY STRESS MEASUREMENT USING SIMULATED DIFFRACTION PROFILES
摘 要
利用模拟衍射线计算了X射线应力测定中不同线形衍射线的峰位角和残余应力的误差，讨论了它们与半高宽(HW)、净峰强度(IP)和峰背比(IP/IB)之间的关系。根据分析结果,分别推导出不同线形衍射线的峰位角和残余应力误差的计算公式，并利用实测衍射线考察了该公式的可靠性。
峰位角
残余应力
误差
Simulated diffraction profiles
Peak position
Residual stress
Errors
Abstract
Simulated X-ray diffraction profiles are used to calculate the peak position errors and residual stress errors in X-ray residual stress measurement respectively. The dependences of the errors on half width (HW), peak intensity of line-less-background (IP) and the ratio of peak intensity of line-less-background to background intensity (IP/IB) are analyzed to deduce the errors formula for the peak position and residual stress, which are validated by the measured X-ray diffraction profiles.
中图分类号 TG115.23
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收稿日期 2005/11/18
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备注贺笑春(1976-)，女，博士研究生。
引用该论文: HE Xiao-chun,LI Jia-bao. ON THE ERRORS FORMULA FOR X-RAY STRESS MEASUREMENT USING SIMULATED DIFFRACTION PROFILES[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2006, 42(3): 125～128
贺笑春,李家宝. 利用模拟衍射线计算X射线应力测定中的误差[J]. 理化检验－物理分册, 2006, 42(3): 125～128
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参考文献
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【2】Langford J I. A Rapid Method for Analysing the Breadths of Diffraction and Spectral Lines Using the Voigt Function[J]. J Appl Cryst, 1978,11:10-14.
【3】Wu E, Gray E, MacA, et al. Modelling Dislocation Induced Anisotropic Line Broadening in Rietveld Refinements Using a Voigt Function. I. General Principles[J]. J Appl Cryst, 1998,31:356-362.
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【8】Kurita M, Hirayama H. An Estimation of Hardness of Hardened Steels by X-ray Diffraction Using a Gaussion Curve-fitting Method[J]. Journal of Testing and Evaluation, 1984,12(1):13-19.
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