基于影像板的X射线应力测试新技术
A NEW TECHNIQUE FOR X-RAY STRESS MEASUREMENT BASED ON USING IMAGE PLATE
摘 要
介绍了一种X射线应力测试新技术,基于X射线衍射原理与影像板平面探测器背反射几何,推导出应力测试基本公式,并列举了应用实例。结果证实,该方法具有测试速度快及结果可靠等优点。
应力测试
X射线衍射
Imaging plate
Stress measurement
X-ray diffraction
Abstract
A new technique for X-ray stress measurement has been introduced. The formula of calculating stress are inferred according to the theory of X-ray diffraction and the geometry of back-reflection for X-ray area detector,called an imaging plate (IP). According to the result of the example obtained by the present method,there are some advantages: rapid plane stress analysis and credible measured value.
中图分类号 TG115.22+2.2
所属栏目 实验技术与方法
基金项目
收稿日期 2006/10/11
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备注洪 波(1978-),男,博士研究生。
引用该论文: HONG Bo,JIANG Chuan-hai. A NEW TECHNIQUE FOR X-RAY STRESS MEASUREMENT BASED ON USING IMAGE PLATE[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2007, 43(2): 78～80
洪 波,姜传海. 基于影像板的X射线应力测试新技术[J]. 理化检验－物理分册, 2007, 43(2): 78～80
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