APPLICATION OF SEM AND EDS IN INSPECTION OF PLATING ORNAMENTS
摘 要
采用扫描电镜及X射线能谱仪对首饰镀层进行了检测,并对两种方法进行了比较。结果表明,镀铑首饰采用无损检测法较合适,而镀金首饰采用破坏性检测法较合适。
Abstract
The plating layers of ornaments were inspected by SEM and EDS respectively. The result showed that the ornaments plating with Rh are suitable to be inspected by nondestructive testing method and the ornaments plating with Au are suitable to be inspected by destructive method.
中图分类号 TG115.23
所属栏目 实验技术与方法
基金项目
收稿日期 2006/11/3
修改稿日期
网络出版日期
作者单位点击查看
备注谭 莹(1959-),女,高级工程师,学士。
引用该论文: TAN Ying,ZHANG Zhen-kun,CHEN Ming,CAO Biao,LIU jian-bin. APPLICATION OF SEM AND EDS IN INSPECTION OF PLATING ORNAMENTS[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2007, 43(4): 185~157
谭 莹,张震坤,陈 明,曹 标,刘健斌. 扫描电镜及X射线能谱仪在首饰镀层检测中的应用[J]. 理化检验-物理分册, 2007, 43(4): 185~157
被引情况:
【1】方飞, "扫描电镜结合图像处理对人牙微观结构的分析",理化检验-物理分册 48, 148-150(2012)
共有人对该论文发表了看法,其中:
人认为该论文很差
人认为该论文较差
人认为该论文一般
人认为该论文较好
人认为该论文很好
相关信息