用原子力显微镜分析Al2O3抛光处理的ITO玻璃表面形貌
SURFACE CHARACTERISTIC OF ITO GLASS POLISHED Al2O3 USING ATOMIC FORCE MICROSCOPY
摘 要
利用原子力显微镜(AFM)研究有机电致发光器件的阳极材料铟锡氧化物(ITO)玻璃的表面形貌。结果表明,用不同粒度Al2O3抛光液处理以及用相同粒度Al2O3抛光液在不同超声时间处理的ITO表面形貌都有不同程度的变化,所制备的有机电致发光器件(OLED)性能也有相应的改变,制备的OLED的最大亮度由12 350 cd/m2提高到25 880 cd/m2,最大效率也提高了50%。基于AFM形貌研究,确定了OLED的优化条件。
铟锡氧化物
抛光处理
有机电致发光器件
Atomic force microscopy
Indium tin oxide
Polishing treatment
Organic light-emitting device
Abstract
The surface characteristic of Indium-Ti-Oxide were observed using atomic force microscopy. The results indicated that there were differences between surface characteristic of ITO glass after polished by containing different granularity Al2O3 solutions,so did containing uniform granularity Al2O3 while different ultrasonic treatment. Performance changed with the different ITO glass surface characteristic. The maximum brightness was promoted from 12 350 cd/m2 to 25 880 cd/m2 after treatment,and the maximum efficiency could increase 50%. Optimization conditions of manufacture OLED were confirmed according the surface characteristic study using AFM.
中图分类号 TB381
所属栏目 试验与研究
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引用该论文: GENG Li-wei,ZHANG Xiao-yan,WANG Li,WANG Guang-de. SURFACE CHARACTERISTIC OF ITO GLASS POLISHED Al2O3 USING ATOMIC FORCE MICROSCOPY[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2007, 43(9): 433～436
耿立威,张晓燕,王 立,王广德. 用原子力显微镜分析Al2O3抛光处理的ITO玻璃表面形貌[J]. 理化检验－物理分册, 2007, 43(9): 433～436
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参考文献
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【2】Jonda C,Mayer A B R,Stolz U,et al. Surface roughness effects and their influence on the degradation of organic light emitting devices［J］. J Mater Sci,2000,35:5645-5647．
【3】Liu J M,Lu P Y,Weng W K. Studies on modifications of ITO surfaces in OLED devices by Taguchi methods［J］. Material Science Engineering B,2001,85:209-211．
【4】Kim J S,Friend R H,Cacialli F. Surface energy and polarity of treated indium2tin2oxide anodes for polymer Light-emitting diodes studied by contact-angle measurements［J］. J Appl Phys,1999,86:2774-2777．
【5】Song W J,So S K,Wang D Y,et al. Angle dependent X-ray photoemission study on UV-ozone treatment of indium tin oxide［J］. Appl Surf Sci,2001,177:158-161．
【6】He P,Wang S D,Wong W K,et al. Vibrational analysis of oxygen-plasma treated indium tin oxide［J］. Chemical Physics Letters,2003,370:795-798．
【7】Destruel P,Bock H,Seguy I,et al. Influence of indium tin oxide treatment using UV-ozone and argon plasma on the photovoltaic parameters of devices based on organic discotic materials［J］. Polymer International,2006,55:601-603．
【8】Yan C,Zharnikov M,Golzhauser A,et al. Preparation and characterization of self-assembled monolayers on indium tin oxide［J］. Langmuir,2000,16:6208-6210．
【9】Dietz P,Hansma P K,Inacker O,et al. Surface pore structure of micro and ultrafiltration-membranes imaged with the atomic force microscope［J］. Journal of Membrane Science,1992,65:101-111．
【10】Khbvlbe K C,Matsuura T. Characterization of synthetic membranes by Raman spectroscopy,electron spin resonance,and atomic fore microscope;a review［J］. Polymer,2000,41:1917-1935．
【11】Moller C,Allen M,Engel A,et al. Tapping-mode atomic force microscopy produces faithful high-resolution images of protein surfaces［J］. Biophys Journal,1999,77(2):1150-1158．
【12】Bowen W R,Doneva T A. Atomic force microscopy studies of nanofiltration membranes;surface morphyology,pore size distribution and adhesion［J］. Desalination,2000,129:163-172．
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