电感耦合等离子体质谱法测定高纯稀土样品中多种非稀土杂质
ICP-MS Determination of 24 Non-Rare Earth Elements Present as Impurities in High-Purity Rare-Earth Sample
摘 要
研究建立了高纯稀土样品中24种非稀土杂质元素的电感耦合等离子质谱法(ICP-MS)测定方法.考察了几类典型金属样品分析中的基体效应,引入内标元素铟,有效补偿了基体效应引起的非质谱干扰.对几种在分析过程中存在质谱干扰的样品,通过分离基体进行测定.方法测定下限为1.8~390 ng·g-1,RSD为2.9%~5.4%,加标回收率为92%~107%.
高纯稀土样品
非稀土杂质
ICP-MS
Impurities of non-rare-earth elements
High-purity rare-earth sample
Abstract
ICP-MS was applied to the determination of 24 non-rare-earth elements present as impurities in 15 high-purity rare-earth samples.Matrix effect,taking Sm,Tb and Tm as testing objects,were studied.Non-mass spectrometric interferences induced by matrix effect were compensated by the addition of indium as internal standard.Analysis of samples having MS-interferences was carried out after the separation of the matrix elements.Detection limits,recovery and RSD′s for the method were found in the range 1.8-390 ng·g-1,92%-107% and 2.9%-5.4% respectively.
中图分类号 O614.33
所属栏目 工作简报
基金项目
收稿日期 2005/12/11
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备注刘晶磊(1962-),男,江西新余人,副研究员,从事电感耦合等离子质谱在高纯产品中的分析与研究.
引用该论文: LIU Jing-lei,LI Xiang,LIU Yong-lin,LIN Ping,YI Yong,SU Ya-qin,ZHANG Xin-quan. ICP-MS Determination of 24 Non-Rare Earth Elements Present as Impurities in High-Purity Rare-Earth Sample[J]. Physical Testing and Chemical Analysis part B:Chemical Analysis, 2007, 43(6): 457～459
刘晶磊,李翔,刘永林,林平,易永,苏亚勤,章新泉. 电感耦合等离子体质谱法测定高纯稀土样品中多种非稀土杂质[J]. 理化检验－化学分册, 2007, 43(6): 457～459
被引情况:
【1】孙建之, "锂的测定方法的进展",理化检验－化学分册 45, 1240-1244(2009)
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参考文献
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