二氧化碳激光诱导沉积银层的表征
Characterization of Silver Layer Deposited by Carbon Dioxide Laser Induction
摘 要
对运用二氧化碳激光诱导局域沉积的银层进行了扫描电镜(SEM)、电子探针(EPMA)、原子力显微镜(AFM)和X射线光电子能谱(XPS)分析.结果表明:沉积层在基体环氧树脂玻璃纤维板表面呈“孤岛状”分布,没有宏观导电性;而且由于在沉积过程中一部分沉积物扩散到基体内部,使沉积层与基体有很好的结合力,它又充当了后续的化学镀铜层与基体间的过渡层;试验证实沉积层中的银以单质形式存在,除银外,还含有氧、氮、碳等杂质元素.
诱导沉积
银层
扫描电镜
电子探针
原子力显微镜
X射线光电子能谱分析
CO2-laser
Induced deposition
Silver layer
SEM
EPMA
AFM
XPS
Abstract
Testing methods including scanning electron microscopy (SEM),electron probe microanalysis (EPMA),atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS),were used in the characterization of the silver layer deposited locally by CO2-laser induction.As shown by experimental results,the deposited silver layer was distributed just like “isolated islands” on the surface of the substrate of epoxy resin glass fibre board,and showed no macro-conductivity.Strong adhesion of the silver layer to the substrate was obtained due to its partial diffusion into the substrate,and behaved as a transitional layer between the copper layer and the substrate in further chemical plating of copper.It was also verified experimentally that silver in the deposited layer was present as simple substance,occluded with impurities of oxygen,nitrogen and carbon.
中图分类号 TN248.2
所属栏目 工作简报
基金项目
收稿日期 2007/6/11
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备注刘建国(1973-),男,河南鲁山人,博士后,主要从事光电材料化学的研究.
引用该论文: LIU Jian-guo,LI Pin,ZHANG Xiao-hong,ZHENG Jia-shen. Characterization of Silver Layer Deposited by Carbon Dioxide Laser Induction[J]. Physical Testing and Chemical Analysis part B:Chemical Analysis, 2008, 44(2): 149～151
刘建国,李平,张晓红,郑家燊. 二氧化碳激光诱导沉积银层的表征[J]. 理化检验－化学分册, 2008, 44(2): 149～151
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参考文献
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