XRFS Analysis for Composition of IC10 Alloy
摘 要
提出了X射线荧光光谱法测定IC10合金的主量元素及控制限元素含量的方法.采用虚拟定值法对限量元素进行定值,用基本参数法(单点标准比较法)对主量元素进行定值.结果表明:主量元素的相对标准偏差(n=11)均小于0.35%;控制限元素的相对标准偏差均小于2.0%.
Abstract
A method of XRFS for determination of major elements and elements of control contents in IC10 alloy was proposed.The elements of control contents were determined by virtual valuation method;and the major elements were determined by the basic parameter method (i.e.the single-point comparative standard).It was found that values of RSD′s (n=11) of major elements and elements of control contents were less than 0.35% and 2.0%,respectively.
中图分类号 O657.34
所属栏目 工作简报
基金项目
收稿日期 2010/1/12
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备注张继民(1956-),男,辽宁人,高级工程师,从事材料的化学分析工作.
引用该论文: ZHANG Ji-min,TANG Xia. XRFS Analysis for Composition of IC10 Alloy[J]. Physical Testing and Chemical Analysis part B:Chemical Analysis, 2010, 46(7): 751~753
张继民,唐侠. X射线荧光光谱法分析IC10合金成分[J]. 理化检验-化学分册, 2010, 46(7): 751~753
被引情况:
【1】闫秀芬,唐侠,张环月, "X射线荧光光谱法测定镍基高温合金中合金组分的通用工作曲线的制作——基本参数(FP)法虚拟合成标准样品的应用",理化检验-化学分册 50, 1434-1440(2014)
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参考文献
【1】梁钰.X射线荧光光谱分析基础[M].北京:科学出版社,2007:98-102.
【2】黄近丹.X射线荧光外标实验校正法测定铂材料中4种主要元素[J].冶金分析,2001(6):44-46.
【3】ASTM E 1622Standard practice for correcfion of spectral line overlap in wavelength-dispersive X-ray spectrometry[S].
【2】黄近丹.X射线荧光外标实验校正法测定铂材料中4种主要元素[J].冶金分析,2001(6):44-46.
【3】ASTM E 1622Standard practice for correcfion of spectral line overlap in wavelength-dispersive X-ray spectrometry[S].
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