Inspection of Composition of Thin Film of CdS by XPS and Depth Profiling
摘 要
用X射线光电子能谱法(XPS)对化学水浴沉积法制得的硫化镉薄膜的成分进行表征和深度剖析。用能量为2×103eV的Ar+刻蚀3 800 s,90层。对Cd3d、S2p和O1s的90个谱峰的高分辨图谱的分析和对谱峰的曲线拟合,得出以下结论:① 除最外层和玻璃基底层以外的其他层中氧元素的质量分数都在6%左右,即CdS占94%左右;② 欲获得均匀的CdS薄膜,需一次制备成型;③ 在形成CdS薄膜的诱发期主要是Cd2+和S2-的结合形成CdS,此时并无CdO和Cd(OH)2的形成;④ 由于玻璃衬底的亲水性以及氨水的分解产生的OH-形成了生成Cd(OH)2的条件,而CdO的存在主要是因为Cd(OH)2在蒸发时分解产生的;⑤ 根据半定量测定,相对于94%的CdS而言,Cd(OH)2的含量为2.7%,CdO的含量为2.2%,吸附氧的含量为1.1%。
Abstract
Thin film of CdS prepared by chemical bath deposition was characterized by XPS and depth profiling. The thin film was etched with Ar+ (2×103eV) for 3 800 s to give 90 layers. Through an ultimate analysis of the 90 spectrampeaks of Cd3d, S2p and O1s in the high resolution XPS spectra and applying depth profiling, the following cognitions were drawn:① besides the surface layer and the glass base liner, contents of oxygen in each of the remaining layer were around 6%, and contents of CdS were attained to 94%; ② in order to obtain an homogeneous and even thin film of CdS, the preparation should be completed in one stroke; ③ during the inducing period for formation of the thin film of CdS, binding of Cd2+ with S2- was the main reaction, and that no formation of CdO and Cd(OH)2 was found in this period; ④ causes for formation of Cd(OH)2 were the hydrophilicity of the glass base liner and the dissociation of aqueous ammonia which gives OH- group for forming Cd(OH)2; while the presence of CdO was due to the decomposition of Cd(OH)2 during evaporation. ⑤ it was found by semi-quantification that the relative contents of Cd(OH)2, CdO and adsorbed oxygen were 2.7%, 2.2% and 1.1% respectively as in respect to the content of CdS of 94%.
中图分类号 O657.62 DOI 10.11973/lhjy-hx201701006
所属栏目 工作简报
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收稿日期 2015/12/16
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备注陈静允(1986-),女,河南周口人,工程师,主要从事XPS、XRD、XRF的分析表征工作。E-mail:chenjingyun@nicener-gy.com
引用该论文: CHEN Jing-yun,LONG Yin-hua,ZUO Ning,MA Lin-ge,GUO Kai. Inspection of Composition of Thin Film of CdS by XPS and Depth Profiling[J]. Physical Testing and Chemical Analysis part B:Chemical Analysis, 2017, 53(1): 28~33
陈静允,龙银花,左宁,马琳鸽,郭凯. X射线光电子能谱法和深度剖析法检测CdS薄膜的成分[J]. 理化检验-化学分册, 2017, 53(1): 28~33
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参考文献
【1】MORRIS G C, TOTTSZER A, DAS S K. Comparison between evaporated and eletrodeposited cadmium sulfide for nCdS/pCdTe solar cells[J]. Metal Forum, 1991,15(2):164-170.
【2】NAIR P K, NAIR M T S, GARCIA V M, et al. Semiconductor thin films by chemical bath deposition for solar energy related applications[J]. Solar Energy Material and Solar Cells, 1998,52(3/4):313-344.
【3】KIM D, FAHRENBRUCH A L, LOPEZ-OTERO A, et al. Measurement and control of ion-doping-induced defects in cadmium telluride films[J]. Journal of Applied Physics, 1994,75(5):2673-2679.
【4】HETTERICH M, PETILLON S, PETRI W, et al. Wurtzite ZnxCd1-xS layers grown by combining MBE and hot-wall beam epitaxy[J]. Journal of Crystal Growth, 1996,159(1/2/3/4):81-84.
【5】KUHAIMI S A A. Influence of preparation technique on the structural,optical and electrical properties of polycrystalline CdS films[J]. Vacuum, 1998,51(3):349-355.
【6】XUE Y M, SUN Y, HE Q, et al. Structural characteristic of CdS thin films and their influences on Cu(In, Ga)Se2 (CIGS) thin film solar cells[J]. Chinese Journal of Semiconductors, 2005,26(2):226-229.
【7】王建波,娄朝刚,张晓兵,等.CdS纳米薄膜的水浴法制备与表征[J].真空电子技术, 2006(1):22-25.
【8】段宇波,张弓,庄大明.水浴温度对化学浴沉积CdS薄膜性能的影响[J].中国表面工程, 2010,23(5):21-26.
【9】ORTEGABORGES R, LINCOT D. Mechanism of chemical bath deposition of cadmium sulfide thin films in the ammoni-athiourea system[J]. Journal of the Electrochemical Society, 1993,140(12):3464-3473.
【10】DONA J M, HERRERO J. Chemical bath deposition of CdS thin films:an approach to the chemical mechanism through study of the film microstructure[J]. Journal of the Electrochemical Society, 1997,144(11):4081-4091.
【11】白鹏,张弓,庄大明,等.水浴温度对化学水浴法沉积CdS和ZnS薄膜性能的影响[J].太阳能学报, 2014,35(3):481-486.
【12】刘高斌,郭江,冯庆,等.硫化镉薄膜的XPS研究[J].光电子技术, 2002,22(3):141-144.
【13】孙云,王俊清,杜兆峰,等.CIS和CIGS薄膜太阳电池的研究[J].太阳能学报, 2001,22(2):192-195.
【14】MOULDER J F, STICKLE W F, SOBOL P E, et al. Handbook of X-ray photoelectron spectroscopy:a reference book of standard spectra for identification and interpretation of XPS data[M]. US:Physical Electronics, 1995:122-123.
【15】薛玉明,孙云,周志强,等.CdS薄膜中"白斑"的研究[J].人工晶体学报, 2005,34(4):620-623.
【16】刘朝旺,宋炳文.用XPS进行镉的表面化学态研究[J].红外技术, 1995,17(1):11-15.
【17】KIM C M, JEONG H S, KIM E H. NEXAFS and XPS characterization of molecular oxygen adsorbed on Ni(100) at 80K[J]. Surface Science, 2000,459(1/2):L457-L461.
【18】KITAKATSU N, MAURICE V, HINNEN C, et al. Surface hydroxylation and local structure of NiO thin films formed on Ni(Ⅲ)[J]. Surface Science, 1998,407(1/2/3):36-58.
【19】JESUS J C D, CARRAZZA J, PEREIRA P, et al. Hydroxylation of NiO films:the effect of water and ion bombardment during the oxidation of nickel foils with O2 under vacuum[J]. Surface Science, 1998,397(1/2/3):34-37.
【20】JINESH K B, WILSON K C, THAMPI S V, et al. How quantum confinement comes in chemically deposited CdS?-A detailed XPS investigation[J]. Physica E:Low-dimensional Systems and Nanostructure, 2003,19(3):303-308.
【2】NAIR P K, NAIR M T S, GARCIA V M, et al. Semiconductor thin films by chemical bath deposition for solar energy related applications[J]. Solar Energy Material and Solar Cells, 1998,52(3/4):313-344.
【3】KIM D, FAHRENBRUCH A L, LOPEZ-OTERO A, et al. Measurement and control of ion-doping-induced defects in cadmium telluride films[J]. Journal of Applied Physics, 1994,75(5):2673-2679.
【4】HETTERICH M, PETILLON S, PETRI W, et al. Wurtzite ZnxCd1-xS layers grown by combining MBE and hot-wall beam epitaxy[J]. Journal of Crystal Growth, 1996,159(1/2/3/4):81-84.
【5】KUHAIMI S A A. Influence of preparation technique on the structural,optical and electrical properties of polycrystalline CdS films[J]. Vacuum, 1998,51(3):349-355.
【6】XUE Y M, SUN Y, HE Q, et al. Structural characteristic of CdS thin films and their influences on Cu(In, Ga)Se2 (CIGS) thin film solar cells[J]. Chinese Journal of Semiconductors, 2005,26(2):226-229.
【7】王建波,娄朝刚,张晓兵,等.CdS纳米薄膜的水浴法制备与表征[J].真空电子技术, 2006(1):22-25.
【8】段宇波,张弓,庄大明.水浴温度对化学浴沉积CdS薄膜性能的影响[J].中国表面工程, 2010,23(5):21-26.
【9】ORTEGABORGES R, LINCOT D. Mechanism of chemical bath deposition of cadmium sulfide thin films in the ammoni-athiourea system[J]. Journal of the Electrochemical Society, 1993,140(12):3464-3473.
【10】DONA J M, HERRERO J. Chemical bath deposition of CdS thin films:an approach to the chemical mechanism through study of the film microstructure[J]. Journal of the Electrochemical Society, 1997,144(11):4081-4091.
【11】白鹏,张弓,庄大明,等.水浴温度对化学水浴法沉积CdS和ZnS薄膜性能的影响[J].太阳能学报, 2014,35(3):481-486.
【12】刘高斌,郭江,冯庆,等.硫化镉薄膜的XPS研究[J].光电子技术, 2002,22(3):141-144.
【13】孙云,王俊清,杜兆峰,等.CIS和CIGS薄膜太阳电池的研究[J].太阳能学报, 2001,22(2):192-195.
【14】MOULDER J F, STICKLE W F, SOBOL P E, et al. Handbook of X-ray photoelectron spectroscopy:a reference book of standard spectra for identification and interpretation of XPS data[M]. US:Physical Electronics, 1995:122-123.
【15】薛玉明,孙云,周志强,等.CdS薄膜中"白斑"的研究[J].人工晶体学报, 2005,34(4):620-623.
【16】刘朝旺,宋炳文.用XPS进行镉的表面化学态研究[J].红外技术, 1995,17(1):11-15.
【17】KIM C M, JEONG H S, KIM E H. NEXAFS and XPS characterization of molecular oxygen adsorbed on Ni(100) at 80K[J]. Surface Science, 2000,459(1/2):L457-L461.
【18】KITAKATSU N, MAURICE V, HINNEN C, et al. Surface hydroxylation and local structure of NiO thin films formed on Ni(Ⅲ)[J]. Surface Science, 1998,407(1/2/3):36-58.
【19】JESUS J C D, CARRAZZA J, PEREIRA P, et al. Hydroxylation of NiO films:the effect of water and ion bombardment during the oxidation of nickel foils with O2 under vacuum[J]. Surface Science, 1998,397(1/2/3):34-37.
【20】JINESH K B, WILSON K C, THAMPI S V, et al. How quantum confinement comes in chemically deposited CdS?-A detailed XPS investigation[J]. Physica E:Low-dimensional Systems and Nanostructure, 2003,19(3):303-308.
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