X射线粉末衍射的发展与应用——纪念X射线粉末衍射发现一百年(续前)
Development and Application of X-ray Powder Diffraction-To Commemorate the Discovery of X-ray Powder Diffraction for One Hundred Years (Continued)
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Abstract
中图分类号 TG115.22 DOI 10.11973/lhjy-wl201705006
所属栏目 专题讲座
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收稿日期 2016/4/20
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备注马礼敦(1935-),男,教授,主要从事X射线晶体学方面的教学与研究工作,ldma@fudan.edu.cn
引用该论文: MA Lidun. Development and Application of X-ray Powder Diffraction-To Commemorate the Discovery of X-ray Powder Diffraction for One Hundred Years (Continued)[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2017, 53(5): 325～332
马礼敦. X射线粉末衍射的发展与应用——纪念X射线粉末衍射发现一百年(续前)[J]. 理化检验－物理分册, 2017, 53(5): 325～332
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参考文献
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【2】VALLCORBA O,RIUS J,FRONTERA C,et al.DAJUST:a suite of computer programs for pattern matching,space-group determination and intensity extraction from powder diffraction data[J]. Journal of Applied Crystallography,2012,45(4):844-848.
【3】POULSEN H F. An introduction to three-dimensional X-ray diffraction microscopy[J]. Journal of Applied Crystallography,2013,45(6):1084-1097.
【4】LARSON B C,LEVINE L E.Submicrometre-resolution polychromatic three-dimensional X-ray microscopy[J].Journal of Applied Crystallography,2001,46(1):153-164.
【5】ALVAREZ-MURGA M,BLEUET P,HODEAU J-L.Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materials[J].Journal of Applied Crystallography,2001,45(6):1109-1124.
【6】RODRIGUEZ J A,XU R,CHEN C C,et al.Oversampling smoothness:An effective algorithm for phase retrieval of noisy diffraction intensities[J].Journal of Applied Crystallography,2012,46(2):312-318.
【7】RODRIGUEZ J A,XU R,CHEN C C,et al.Three-dimensional coherent X-ray diffractive imaging of whole frozen-hydrated cells[J].IUCrJ,2015,2(5):575-583.
【8】REISCHIG P,KING A,NERVO L,et al.Advances in X-ray diffraction contrast tomography:flexibility in the setup geometry and application to multiphase materials[J].Journal of Applied Crystallography,2013,46(2):297-311.
【9】ALLEN D,WITTGE J,STOPFORD J,et al.Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in silicon[J].Journal of Applied Crystallography,2011,44(3):526-531.
【2】VALLCORBA O,RIUS J,FRONTERA C,et al.DAJUST:a suite of computer programs for pattern matching,space-group determination and intensity extraction from powder diffraction data[J]. Journal of Applied Crystallography,2012,45(4):844-848.
【3】POULSEN H F. An introduction to three-dimensional X-ray diffraction microscopy[J]. Journal of Applied Crystallography,2013,45(6):1084-1097.
【4】LARSON B C,LEVINE L E.Submicrometre-resolution polychromatic three-dimensional X-ray microscopy[J].Journal of Applied Crystallography,2001,46(1):153-164.
【5】ALVAREZ-MURGA M,BLEUET P,HODEAU J-L.Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materials[J].Journal of Applied Crystallography,2001,45(6):1109-1124.
【6】RODRIGUEZ J A,XU R,CHEN C C,et al.Oversampling smoothness:An effective algorithm for phase retrieval of noisy diffraction intensities[J].Journal of Applied Crystallography,2012,46(2):312-318.
【7】RODRIGUEZ J A,XU R,CHEN C C,et al.Three-dimensional coherent X-ray diffractive imaging of whole frozen-hydrated cells[J].IUCrJ,2015,2(5):575-583.
【8】REISCHIG P,KING A,NERVO L,et al.Advances in X-ray diffraction contrast tomography:flexibility in the setup geometry and application to multiphase materials[J].Journal of Applied Crystallography,2013,46(2):297-311.
【9】ALLEN D,WITTGE J,STOPFORD J,et al.Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in silicon[J].Journal of Applied Crystallography,2011,44(3):526-531.
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