采用扫描电子显微镜对镀膜玻璃、硅片、焊带、背板等光伏原辅材料进行测试及分析，分别介绍了扫描电子显微镜在镀膜玻璃膜层结构观察、膜厚测量、硅片表面形貌及间距分析、焊带表面微观分析、背板类型分辨、各层厚度测量等方面的应用，其结果可为镀膜玻璃的性能研究、电池片工艺优化分析、焊带性能评估、背板验货及鉴定等光伏原辅材料的研究及测试提供依据。

Several kinds of photovoltaic raw and auxiliary materials were tested and analyzed by scanning electron microscope, such as coating glass, silicon wafers, welding strips and back sheets. The application of scanning electron microscope in different fields were introduced respectively, including structure observation, measurement of layers of coating glass, analysis on surface morphology and space measurement of silicon wafers, micro analysis on the welding strip surface, type distinguish and thickness measurement of back sheets. The results could provide reference for the research and test of photovoltaic raw and auxiliary materials, such as performance research of coating glass, process optimization analysis of solar cells, performance evaluation of welding strips, inspection and identification of backsheets.