采用X射线荧光光谱法测定了多种含钨合金钢以及含钨较高的镍基和钴基合金中钨的含量。方法中选择钨的L_β1线为分析线，并选择2θ角在39.50°处作为背景位置。在合金中钽的L_β2线对钨分析线有重叠干扰，选两套标准样品用基本参数法（FP）测出了干扰系数k，将k值列入仪器的FP工作软件中来消除钽对钨测定的重叠干扰。用所提出的方法分析了钨质量分数在0.054%~11.71%内的5个标准样品，测定值与认定值相符，测定值的相对标准偏差（n=7）在0.55%~9.5%之间。

XRFS was applied to the determination of tungsten in various tungsten containing alloy stees, Ni-based and Co-based alloys. The spectral line of L_β1 of W was chosen as analytical spectral line, and 2θ of 39.50° was selected as background site. Spectral line of L_β2 of Ta was found to interfere with the line of L_β1 of W. Two sets of standard samples were selected and fundamental parameter (FP) method was used with help of FP software to find out the overlap-interfering coefficient k, which was listed in FP software to eliminate the overlap-interference from Ta to W.5 standard samples with W content ranging from 0.054% to 11.71%, were analyzed by the proposed method, giving results in consistency with the certified values, and RSDs (n=7) ranged from 0.55% to 9.5%.