利用Regulus 8230型高分辨率扫描电镜对导电性能较差的玉米淀粉进行微观形貌观察,对比分析了试样分散方法、喷金处理及不同电压模式对玉米淀粉扫描电镜图像质量的影响。结果表明:超声波分散法可获得更加均匀的颗粒分布,有利于对玉米淀粉的微观形貌进行观察;对喷金处理后的玉米淀粉进行扫描电镜低倍观察时,荷电效应降低,图像质量得到改善;对喷金处理后的玉米淀粉进行扫描电镜高倍观察时,颗粒表面出现裂纹,因此不建议进行喷金处理;对未喷金处理的玉米淀粉采用电子束减速模式进行观察,可显著提升扫描电镜的图像质量。

Regulus 8230 high resolution scanning electron microscope was used to observe the microstructure of corn starch with poor conductivity. The effects of sample dispersion method, gold spraying treatment and different voltage modes on the image quality of scanning electron microscope of corn starch were compared and analyzed. The results showed that the ultrasonic dispersion method could obtain more uniform particle distribution, which was conducive to the observation of the microstructure of corn starch. The charge effect was decreased and the image quality was improved when the corn starch after gold spraying was observed by scanning electron microscope at low magnification. When the corn starch after gold spraying was observed by scanning electron microscope at high magnification, cracks appeared on the particle surface, so gold spraying was not recommended. For non-gold sprayed corn starch, electron beam deceleration mode should be used for observation, which could significantly improve the image quality of scanning electron microscope analysis.