Failure Reasons of Connector Terminals of Automotive Controller
摘 要
对某款实际应用的汽车控制单元连接器进行温度循环耐久试验,利用控制单元供电电压对整个试验过程中连接器端子接触电阻增加情况进行监控,并通过电路热成像、扫描电镜(SEM)及能谱仪(EDS)分析了连接器端子失效的原因。结果表明:连接器端子失效是由电路板不均衡发热与环境温度交变引起的摩擦腐蚀、材料氧化、金属扩散和金属蠕变等因素共同导致。
Abstract
The failure reasons of the connector terminals of an actual applied automotive controller were analyzed through temperature cycle endurance tests on the connector, monitoring the increase of contact resistance of the connector terminals during the whole test process by applied voltage, the thermal imaging of circuit, examination with scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS). The results showed that the failure of the connector terminals was caused by a combination of fretting corrosion due to imbalanced emitting heat of circuit and alternating of environmental temperature, material oxidation, metal diffusion and metal creep.
中图分类号 U463.6 U467.3 DOI 10.11973/fsyfh-202211018
所属栏目 失效分析
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收稿日期 2020/11/16
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引用该论文: ZHAO Lingguo,ZHAO Mulong,ZHANG Jing. Failure Reasons of Connector Terminals of Automotive Controller[J]. Corrosion & Protection, 2022, 43(11): 101
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参考文献
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【2】AJAY P. Current Trends in Automotive Wire Harness Design[C]//International Conference on Mechanical, Production and Automobile Engineer(ICMPAE'2011), 2011:277-279.
【3】Performance specification for automotive electrical connector systems:SAE/USCAR-2-2013[S].[S.l.]:[s.n.], 2013.
【4】PARK Y W, SANKARA NARAYANAN T S N, LEEK Y. Fretting corrosion of tin-plated contacts[J]. Tribology International, 2008, 41(7):616-628.
【5】PARK Y W, NARAYANAN T S N S, LEE K Y. Effect of temperature on the fretting corrosion of tin plated copper alloy contacts[J]. Wear, 2007, 262(3/4):320-330.
【6】STENNETT N A, SWINGLER J. The effect of power on low frequency fretting corrosion[C]//Proceedings of IEEE Holm Conference on Electrical Contacts.[S.l.]:IEEE, 1993:205-210.
【7】LEE A, MAO A, MAMRICK M S. Fretting corrosion of tin at elevated temperatures[C]//Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts.[S.l.]:IEEE, 1988:87-91.
【8】SWINGLER J. The automotive connector:the influence of powering and lubricating a fretting contact interface[J]. Proceedings of the Institution of Mechanical Engineers, Part D:Journal of Automobile Engineering, 2000, 214:615-623.
【9】骆燕燕, 王振, 李晓宁, 等. 电连接器热循环加速试验与失效分析研究[J]. 兵工学报, 2014, 35(11):1908-1913.
【10】卢兆明. 道路车辆-电气和电子装备的环境条件和试验第5部分:化学环境(ISO16750.5)[J]. 环境技术, 2007, 25(5):45-47.
【11】CHEN L D, HUANG M L, ZHOU S M. Effect of electromigration on intermetallic compound formation in line-type Cu/Sn/Cu interconnect[J]. Journal of Alloys and Compounds, 2010, 504(2):535-541.
【12】CHEN S W, WU S H, LEE S W. Interfacial reactions in the Sn-(Cu)/Ni, Sn-(Ni)/Cu, and Sn/(Cu, Ni) systems[J]. Journal of Electronic Materials, 2003, 32(11):1188-1194.
【13】穆霞英. 蠕变力学[M]. 西安:西安交通大学出版社, 1990.
【14】ZHOU H, JI Q, JIANG P. Research on the mechanism and model of contact resistance[J]. Advanced Materials Research, 2014, 941:580-583.
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