采用电感耦合等离子体原子发射光谱法测定铝锰铁中硅、磷的含量。选择178.242 nm和251.611 nm作为磷、硅的分析谱线,可消除谱线的重叠干扰。使用与分析样品基体相接近的标准样品和相同的测定条件,可克服物理干扰,并比较了酸、碱熔样方式对待测元素的影响。本法已应用于铝锰铁样品中硅、磷的测定,对照试验测定结果的相对标准偏差(n=6)不大于7.0%。

ICP-AES was used to determine silicon and phosphorous in ferroaluminun manganese alloy. Wavelengths of 178.242 nm and 251.611 nm were used as the analytic lines for silicon and phosphorous, which could eliminate overlapping interference of spectral line. The physical interferences were eliminated by using standard sample similar to the matrixes of the analytes at the same experimental conditions. Meanwhile, the effects of the acid or basic solvents were compared. The method was used in the determination of silicon and phosphorous in ferroaluminum manganese alloy. The RSD (n=6) of controlled trials was not more than 7.0%.