XRD Measurement of Residual Stress of Nickel-Based Monocrystalline Superalloy AM1
摘 要
基于Ortner方法用X射线衍射法测量了衍射峰值, 计算了AM1镍基单晶合金喷丸强化后的表面残余应力分布, 分析了衍射位置步长精度及衍射角步长精度对残余应力测量结果的影响。结果表明: 可以运用Ortner方法计算大块AM1镍基单晶合金喷丸处理后的表面残余应力; 测量至少6个晶面的晶面间距方可推导出转换矩阵G, 在测量晶面数量不小于18的情况下, 晶面数量对残余应力测试结果的影响才可以忽略; 当晶面位置参数步长精度为0.3°、衍射角的步长精度为0.01°时, 测得的应力状态基本符合喷丸处理后残余压应力的分布状态。
Abstract
The surface residual stress of a shot peened nickel-based monocrystalline superalloy AM1 was calculated based on the Ortner method by measuring X-ray diffraction peaks, and effects of diffraction position step precision and diffraction angel step precision on measuring results of residual stress were analyzed. The results show that the Ortner method could be used to determine the residual stress of the shot peened chunk of nickel-based monocrystalline superalloy. A tensor matrix G could be determined by measuring the plan distance of at least 6 plans. When the diffraction position step precision was 0.3° and the diffraction angle step precision was 0.01°, the expected results of residual stress distribution after shot peening could be obtained.
中图分类号 TG086
所属栏目 残余应力
基金项目
收稿日期 2011/12/18
修改稿日期 2012/8/17
网络出版日期
作者单位点击查看
备注鞠明(1986-), 女, 辽宁营口人, 硕士研究生。
引用该论文: JU Ming,HUANG Jian,WU Yi-xiong. XRD Measurement of Residual Stress of Nickel-Based Monocrystalline Superalloy AM1[J]. Materials for mechancial engineering, 2013, 37(3): 99~102
鞠明,黄坚,吴毅雄. X射线衍射法测AM1镍基单晶合金的残余应力[J]. 机械工程材料, 2013, 37(3): 99~102
被引情况:
【1】万鑫,詹科,姜传海, "X射线衍射方法分析粗晶铁硅合金的残余应力",机械工程材料 38, 95-99(2014)
【2】任武,李益华,吴运新,张赵威, "列车车轴表层和内部淬火残余应力的有限元模拟",机械工程材料 38, 101-104(2014)
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参考文献
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【2】SUZUKI H, AKITA K, MISAWA H. X-ray stress measurement method for single crystal with unknown stress-free lattice parameter[J].Japanese Journal of Applied Physics,2003,42(5):2876-2880.
【3】ORTNER B. Eigenspannungen[M].[S.l.]: Deutsche Gesellschaft Für Metallkunde, Oberursel,1983:49-68.
【4】陈艳华, 姜传海. 不同取向镍基单晶喷丸层的组织结构与残余应力分布[C]//第十届全国X射线衍射学术大会暨国际衍射数据中心(ICDD)研讨会.上海: [出版者不详],2009:28-29.
【5】HUANG Wen-jun. Grain scale stress and strains determination by x-ray diffraction[D].Paris: Arts et Metiers,2005:46-52.
【6】SAPORTA G. Probabilités analyse des données et statistique[M].Paris:TECHNIP,1990.
【7】ISO/IEC Guide 98:1993 Guide to the expression of uncertainty in measurement[S].
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