提出了应用X射线衍射法定量分析蓝晶石样品。将粒径10~15 μm的蓝晶石粉末置于模具中,制成厚度为0.2 mm的样片。取经提纯的蓝晶石和纯石英,按不同比例配成11个校准样品用于制作工作曲线,每一样品中加入相同量的刚玉作为内标以校正基体干扰。方法用于蓝晶石地质样品分析,所得测定结果与理论值相符。

A method of X-ray diffraction (XRD) for quantitative analysis of kyanite was proposed. The sample was powdered to size between 10 and 15 μm, and pressed in a mould to form a sample wafer with its thickness of 0.2 mm. Eleven calibration samples were prepared by mixing purified kyanite and pure quartz in various proportions and were used for preparation of working curve; same amounts of corundum were added separately to each sample as internal standard for correction of matrix interference. The proposed method was used in the analysis of geological sample of kyanite, and the results obtained were checked quite well with the theoratical values.