连续谱X射线在ICT中的散射修正
Scattering Correction for Continuous Spectrum X-ray ICT
摘 要
在X射线工业计算机断层扫描成像技术(ICT)中，连续谱X射线透射物质时，发生了光子散射现象，有用信息连同散射光子一起进入探头形成伪影。如未修正，必引起赝像。利用X射线透射物质时的X光子散射遵循的Compton散射强度方程，建立了连续谱X射线完整精确的散射修正模型及其修正方法。为有效去除连续谱X光子的散射造成的图像伪影提供比较完善精确的修正模型和修正方法。
散射修正
连续谱
X射线
Industrial computerized tomography
Scattering correction
Continuous spectrum
X-ray
Abstract
In the case of a polychromatic source in X-ray ICT, the phenomenon of scattering takes place.Thus, scattering correction has to be done. According to Compton scattering intensity equation, a theoretical formula of correction of scattered radiation in transmission X-ray industrial computerized tomography was deduced from an ideal model.And the precise accurate models and methods were presented for wiping out the false image efficiently, which resulted from photon scattering.
中图分类号 TG115.28 O434.1 TP391
所属栏目 科研成果与学术交流
基金项目 湖南省教育厅资助科研基金项目
收稿日期 2005/5/31
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备注彭光含(1973-),男，从事工业计算机断层扫描成像技术和扫描隧道显微镜等研究。
引用该论文: PENG Guang-han,QING Li,YANG Xue-heng. Scattering Correction for Continuous Spectrum X-ray ICT[J]. Nondestructive Testing, 2006, 28(11): 579～581
彭光含,卿 莉,杨学恒. 连续谱X射线在ICT中的散射修正[J]. 无损检测, 2006, 28(11): 579～581
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参考文献
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【2】Cao ZJ, Fery EC, Tsui BMW. A scatter model parallel and converging beam SPECT based on the Klein-Nishina formula［J］. IEEE Transaction on Nuclear Science,1994,41(4):1594-1599.
【3】Leiliveld CJ, Maas JG, Eijk CWE van, et al. On the significance of scattered radiation in industrial X-ray computerized tomographic imaging\[J\]. IEEE Transaction on Nuclear Science,1994,41(1):290-294.
【4】Liao Changgeng, Yuan Junqian, He Haiyan, et al. Studied on theory and application of nondestructive inspection using compton scattering\[J\]. Kexue Tongbao,1987,32(8):517.
【5】Lopes RT, Valente CM, De Jesus EFO, et al. Detection of paraffin deposition inside a draining tubulation by the compton scattering technique\[J\]. Appl Radiat Isot,1997,48(10-12):1443-1450.
【6】Guy MJ, Castellano-Smith IA, Flower MA, et al. Detect-dual engergy transmission estimation CT-for improved attenuation correction in SPECT and PET\[J\]. IEEE Transaction on Nuclear Science,1998,45(3):1261-1265.
【7】Rogerio Ferreira de Paiva, John Lynch, Elisabeth Rosenberg, et al. A beam hardening correction for X-ray microtomography\[J\]. NDT & International,1998,31(1):17-22.
【8】Hanke R, Bobel F. Determination of material flaw size by intensity evaluation of polychromatic X-ray transmission\[J\]. NDT & E International,1992,25(2):87.
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