X射线源透射式工业计算机断层扫描成像技术在复合材料工件检测中的散射修正
Scattering Correction for X-ray TICT in Testing Composites Workpiece
摘 要
在X射线源透射式工业计算机断层扫描成像技术(X-TICT)中，X射线透射物质时，发生了Compton光子散射现象，有用信息连同散射光子一起进入探头形成伪影。因此,必须进行散射修正。利用X射线透射物质时X光子散射遵循的Compton散射强度方程，结合X射线与物质相互作用的特性，建立了有效去除X-TICT在复合材料工件检测中光子散射问题造成的图像伪影的散射修正模型。探头的总计数减去散射光子数，即可有效去除X-TICT在复合材料工件检测中散射光子造成的伪影。
散射修正
X射线
复合材料
ICT
Scattering correction
X-ray
Composites
Abstract
In the case of a polychromatic source in X-ray TICT, the phenomenon of Compton photon scattering in material takes place.Scattering photon with useful message getting into detectors leads to false image. The precise accurate models equation of scattering correction about interal composites workpiece in X-ray TICT from Compton scattering intensity equation is deduced for wiping out the false image efficiently,which results from photon scattering. By subtracting the count of scattering photon from the one of each detector,it can wipe off the false image for scattering photon effectively for X-ray TICT in testing composites workpiece.
中图分类号 TG115.28
所属栏目 科研成果与学术交流
基金项目 湖南省教育厅资助科研项目(06C606)；湖南省“十一五”重点建设学科——光学基金资助项目
收稿日期 2005/11/29
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备注彭光含(1973-)，男，博士，讲师。从事工业计算机断层扫描成像技术和扫描隧道显微镜等的研究。
引用该论文: PENG Guang-han,CAI Xin-hua,QIAO Nao-sheng,LIU Chang-qing,YANG Xue-heng. Scattering Correction for X-ray TICT in Testing Composites Workpiece[J]. Nondestructive Testing, 2007, 29(4): 181～184
彭光含,蔡新华,乔闹生,刘长青,杨学恒. X射线源透射式工业计算机断层扫描成像技术在复合材料工件检测中的散射修正[J]. 无损检测, 2007, 29(4): 181～184
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参考文献
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【2】Liao Changgeng, Yuan Junqian, He Haiyan, et al. Studied on theory and application of nondestructive inspection using compton scattering[J]. Kexue Tongbao,1987,32(8):517.
【3】Lopes R T, Valente C M, De Jesus E F O, et al. Detection of paraffin deposition inside a draining tubulation by the compton scattering technique[J]. Appl Radiat Isot,1997,48(10-12):1443-1450.
【4】Cao Z-J, Fery E C, Tsui B M W. A scatter model parallel and converging beam SPECT based on the Klein-Nishina formula[J]. IEEE Transaction on Nuclear Science,1994,41(4):1594-1599.
【5】Leiliveld C J, Maas J G, Van Eijk C W E, et al. On the significance of scattered radiation in ndustrial X-ray computerized tomographic imaging[J]. IEEE Transaction on Nuclear Science,1994,41(1):290-294.
【6】Hanke R, Bobel F. Determination of material flaw size by intensity evaluation of polychromatic X-ray transmission[J]. NDT&E International,1992,25(2):87.
【7】Guy M J, Castellano-Smith I A, Flower M A, et al. Detect-dual engergy transmission estimation CT for improved attenuation correction in SPECT and PET[J]. IEEE Transaction on Nuclear Science,1998,45(3):1261-1265.
【8】Rogerio Ferreira de Paiva, John Lynch, Elisabeth Rosenberg, et al. A beam hardening correction for X-ray microtomography[J]. NDT & International,1998,31(1):17-22.
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