利用公用背底法提高X射线应力分析效率
On the Common Background Method for X-ray Stress Measurement
摘 要
为了提高X射线应力分析的效率，提出了公用背底法对衍射线进行背底扣除。并利用模拟衍射线考察了对于不同峰形的衍射线、公用背底法对残余应力值的影响以及合理的背底取值范围。结果表明，对于峰背比较大的衍射线，公用背底法扣除背底对应力值没有影响，可用来进行应力测定；而对于峰背比较小的衍射线，不适合采用公用背底法扣除背底。利用公用背底法进行应力测定，可以大幅度缩减扫描范围，提高测定效率。
残余应力
公用背底法
应力测定
半高宽
峰位角
Simulated diffraction profiles
Residual stress
Common background method
X-ray stress measurement
Half width
Peak position
Abstract
The common background method dealing with the background of diffraction profile was presented to increase the efficiency of X-ray stress measurement. For the diffraction profiles with different ratios of peak intensity to background intensity (IP/IB), effect of the method on the results of the stress analysis was discussed and the right background range was proposed. For the diffraction profiles with higher IP/IB, the method had no influence on the results of the stress analysis and could be employed. But it was unfeasible to the diffraction profiles with lower IP/IB. And the method could greatly increase the efficiency of X-ray stress measurement by shortening the scanning range of the stress analyzer.
中图分类号 TG115.22+2.2
所属栏目 科研成果与学术交流
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收稿日期 2006/2/27
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备注贺笑春(1976-)，女，博士，从事无损检测工作。
引用该论文: HE Xiao-chun,LI Jia-bao. On the Common Background Method for X-ray Stress Measurement[J]. Nondestructive Testing, 2007, 29(4): 185～188
贺笑春,李家宝. 利用公用背底法提高X射线应力分析效率[J]. 无损检测, 2007, 29(4): 185～188
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参考文献
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【3】Wu E, Gray E MacA, Kisi E H. Modelling dislocation induced anisotropic line broadening in Rietveld refinements using a Voigt function. I. General principles[J]. J Appl Cryst,1998,31(3):356-362.
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