便携式X射线成像仪图像非均匀性分析及校正
Analysis and Correction for Image Nonuniformity of Portable X Radiography Instrument
摘 要
分析了图像非均匀性产生机理，建立了成像仪每个像元通道光电响应的数学模型，提出了非均匀性的多点线性拟合校正算法，对比了校正前后的图像及标准差。结果表明，非均匀性校正方法适用于像元输出值与管电流呈线性关系的X射线成像系统的图像质量改进。
像元响应一致性
非均匀性校正
线性校正
图像处理
X radiography
Pixel response uniformity
Nonuniformity correction
Linear correction
Image processing
Abstract
The nonuniformity was a major concern when X-ray images were evaluated, and it would affect both the detection and classification ability of the imaging instrument. The theoretical principles of the cause for the nonuniformity of digital image were analyzed, linear photoelectric response model of each pixel channel in the imaging instrument was presented, and a multipoint linear fitting correction algorithm was proposed. The images and the standard deviations for the images were given before and after the correction. The nonuniformity correction method was useful for the improvment of image quality when linear relationship between image pixel output and X-ray tube current existed.
中图分类号 TG115.28 TP391.4
所属栏目 科研成果与学术交流
基金项目
收稿日期 2006/3/23
修改稿日期
网络出版日期
作者单位点击查看
备注李俊江(1979-)，男，博士研究生，主要从事X射线成像系统及图像处理方面的研究。
引用该论文: WEI Dong-bo,LI Jun-jiang. Analysis and Correction for Image Nonuniformity of Portable X Radiography Instrument[J]. Nondestructive Testing, 2007, 29(6): 330～333
魏东波,李俊江. 便携式X射线成像仪图像非均匀性分析及校正[J]. 无损检测, 2007, 29(6): 330～333
共有人对该论文发表了看法，其中：
人认为该论文很差
人认为该论文较差
人认为该论文一般
人认为该论文较好
人认为该论文很好
参考文献
【1】陈树越，路宏年.X射线数字成像噪声特性及噪声消除方法研究[J].无损检测,2001,23(1):9-11.
【2】Abbas EI Gamal, Boyd A Fowler, Hao Min, et al. Modeling and estimation of FPN components in CMOS image sensors［C］. Proc SPIE Int Soc Opt Eng,1998,3301,168.
【3】Joseph D, Collins S. Modeling, calibration and correction of nonlinear illumination-dependent fixed pattern noise in logarithmic CMOS image sensors［J］. Instrumentation and Measurement, IEEE Transactions,2002,51(5):996-1001.
【4】Jose M, Lopez-Alonso, Ruben Gonzalez-Moreno, et al. Noise in imaging systems: fixed pattern noise, electronic, and interference noise[J]. Proc SPIE Int Soc Opt Eng,2004,5468, 399.
【5】Pouliquen P O, Andreou A G, Terrill C W, et al. Learning to compensate for sensor variability at the focal plane［C］. Proc Int Conf Neural Networks (IJCNN), Washington, DC: 1999.
【6】高上凯.医学成像系统[M].北京：清华大学出版社,2000,3:24-25.
【7】Nagarkar V, Guptar T, Klugeman Y. Structured CsI(Tl) Scintillator X-ray Imaging Applications[J]. IEEE Transactions on Nuclear Science,1998,45(3):492-496.
【8】美国无损检测学会编，美国无损检测手册译审委员会译.美国无损检测手册·射线卷[M].上海：世界图书出版公司,1992.
【9】蔡文贵，李永远，许振华.CCD技术及应用[M].北京：电子工业出版社,1992.
【2】Abbas EI Gamal, Boyd A Fowler, Hao Min, et al. Modeling and estimation of FPN components in CMOS image sensors［C］. Proc SPIE Int Soc Opt Eng,1998,3301,168.
【3】Joseph D, Collins S. Modeling, calibration and correction of nonlinear illumination-dependent fixed pattern noise in logarithmic CMOS image sensors［J］. Instrumentation and Measurement, IEEE Transactions,2002,51(5):996-1001.
【4】Jose M, Lopez-Alonso, Ruben Gonzalez-Moreno, et al. Noise in imaging systems: fixed pattern noise, electronic, and interference noise[J]. Proc SPIE Int Soc Opt Eng,2004,5468, 399.
【5】Pouliquen P O, Andreou A G, Terrill C W, et al. Learning to compensate for sensor variability at the focal plane［C］. Proc Int Conf Neural Networks (IJCNN), Washington, DC: 1999.
【6】高上凯.医学成像系统[M].北京：清华大学出版社,2000,3:24-25.
【7】Nagarkar V, Guptar T, Klugeman Y. Structured CsI(Tl) Scintillator X-ray Imaging Applications[J]. IEEE Transactions on Nuclear Science,1998,45(3):492-496.
【8】美国无损检测学会编，美国无损检测手册译审委员会译.美国无损检测手册·射线卷[M].上海：世界图书出版公司,1992.
【9】蔡文贵，李永远，许振华.CCD技术及应用[M].北京：电子工业出版社,1992.
相关信息
