Methods in Improving Sensitivity of Industrial Digital Radiography
摘 要
介绍了工业数字射线照相提高钢焊缝中微小缺陷检测灵敏度的最新进展。通过采用微焦点或小焦点X射线源、高灵敏度探测器和设置最佳投影放大率,使像质计(IQI)的灵敏度、影像对比度和空间分辨率达到与常规ISO T3类射线胶片等价的效果。
Abstract
For industrial digital radiography, a new progress in improving small-defect-detection sensitivity in steel welded joints was introduced. Using a micro or mini focus X-ray source, a highly-sensitive detector and an optimum value of project magnification, the equivalent result, rivaling conventional ISO T3-class film in IQI sensitivity, image contrast and space resolution, can be obtained.
中图分类号 TG115.28
所属栏目 仪器方法
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收稿日期 2006/7/31
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备注李 衍(1940-),男,高级工程师,ASME产品责任工程师,负责重要和出口产品的无损检测工作。
引用该论文: LI Yan. Methods in Improving Sensitivity of Industrial Digital Radiography[J]. Nondestructive Testing, 2007, 29(10): 607~608
李 衍. 提高工业数字射线照相灵敏度的新途径[J]. 无损检测, 2007, 29(10): 607~608
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参考文献
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【2】Blakeley B, Spartiotis K. Digital radiography for the inspection of small defects[J]. Insight,2006,48(2):109-112.
【3】Purschke M. IQI sensitivity and applications of flat-panel detectors and X-ray image intensifiers —— A comparison[J]. Insight,2002,44(10):628-630.
【4】Mohr G A, Bueno C. GE A-Si flat panel detector performance for industrial digital radiography[J]. Insight,2002,44(10):631-633.
【5】Ron Halmshaw. Industrial radiography, theory and practice[M]. London & New Jersey: Applied Science Publishers Ltd,1982:147-151.
【6】Blakeley B. Digital radiography —— is it for you[J]. Insight,2004,46(7):403-407.
【2】Blakeley B, Spartiotis K. Digital radiography for the inspection of small defects[J]. Insight,2006,48(2):109-112.
【3】Purschke M. IQI sensitivity and applications of flat-panel detectors and X-ray image intensifiers —— A comparison[J]. Insight,2002,44(10):628-630.
【4】Mohr G A, Bueno C. GE A-Si flat panel detector performance for industrial digital radiography[J]. Insight,2002,44(10):631-633.
【5】Ron Halmshaw. Industrial radiography, theory and practice[M]. London & New Jersey: Applied Science Publishers Ltd,1982:147-151.
【6】Blakeley B. Digital radiography —— is it for you[J]. Insight,2004,46(7):403-407.
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