简要叙述了自X射线衍射发现以来近百年中X射线衍射仪的发展情况,大致可以划分为四个阶段：① 早期的照相机阶段,特点是以照相底片做探测记录器,底片可同时记录许多衍射线，测角器构造简单;② 中期的衍射仪阶段,特点是用计数器做探测器,大大提高了衍射强度的测量准确性,但要逐个记录衍射线，测角器构造复杂,电子技术的应用提高了此阶段仪器的自动化程度;③ 近代的电子计算机衍射仪阶段,特点是现代计算机与X射线衍射仪的结合,提高了衍射仪的自动化程度和检验能力，并增加了数据分析能力，大大促进了X射线衍射术的发展;④ 现代的多功能衍射仪阶段,现代科学技术的高速发展对X射线检验提出了新的要求，发展出一些新的X射线技术，如小角散射、薄膜衍射、反射率测定和微区分析等,把多种不同功能集为一体的多功能X射线衍射仪就此诞生。

The developmental situation of X-ray diffractometer after discovery of X-ray diffraction were reviewed and it may be partitioned into four stages. The early stage is camera stage and the main characteristic of it is that the photo film was used as detector and recorder. Many diffraction lines can be recorded on a film simultaneously, which makes the structure of goniometer is simple. The middle stage is diffractometer stage and the main characteristic of it is that the counter is used as detector, which greatly improves the accuracy of intensities measured. Because intensities of the diffraction lines are recorded one by one，the structure of goniometer is more complex. The instrumental automation of this stage is improved based upon the application of electronics. The neoteric stage is diffractometer-computer stage. The combination of diffractometer and computer not only enhances the instrumental automation and abilities for testing, but also increases the function for data analysis, which makes X-ray diffractometry get a big advance. The modern stage is multi-purpose diffractometer stage. The new requests for X-ray analysis are brought by high speed development of science and technology, and some new X-ray technology, such as small angle scattering, thin-film diffraction, reflectivity measurement, micro analysis and so on, had been developed. The multi-purpose X-ray diffractometer emerged as the time requiring.