金属电子背散射衍射试样的制备技术
METALLOGRAPHIC SAMPLE PREPARATION FOR EBSD
摘 要
电子背散射衍射样品的制备质量对其成像效果的影响至关重要,着重介绍了几种有效的样品制备方法。试验证实,与其他方法相比,机械-化学抛光法具有设备简单、易操作及效果明显等优点。
样品制备
机械-化学抛光
电解抛光
截面抛光
EBSD
Preparation of sample
Chemical-mechanical polishing
Electrolytic polishing
Cross section polishing
Abstract
Since the quality of metallographic sample has great effect on the accuracy and precision of testing results,several preparations of electron backscatter diffraction (EBSD) sample are introduced. Experiments indicate that the chemical-mechanical polishing has much advantage than other methods such as simple equipments,low cost,easy operation and precision results.
中图分类号 TG115.21+1 TB302
所属栏目 试验技术与方法
基金项目
收稿日期 2006/9/11
修改稿日期
网络出版日期
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备注郭宇航(1978-),男,硕士研究生。
引用该论文: GUO Yu-hang,JIN Yun-xue,ZHANG Li-hua,ZHOU hu. METALLOGRAPHIC SAMPLE PREPARATION FOR EBSD[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2007, 43(8): 399～403
郭宇航,金云学,张丽华,周 虎. 金属电子背散射衍射试样的制备技术[J]. 理化检验－物理分册, 2007, 43(8): 399～403
被引情况:
【1】夏雯,刘淑凤,李岩,张丽民, "工业纯钛TA1的金相制样方法",理化检验－物理分册 50, 578-579(2014)
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参考文献
【1】Dingley D J,Baba-Kishi K Z,Randle V. Atlas of back scattering kikuchi diffraction patterns［M］. Bristol: Institute of Physics Publishing,1995．
【2】Adam J S,Mukul K,Brent L A. Electron backscatter diffraction in materials science［M］. New York: Kluwer Academic/Plenum Publishers,2001．
【3】Dingley D J. A comparison of diffraction techniques for SEM［J］. Scanning Electron Micro Sco-py,1981,Ⅳ:273-286．
【4】Randle V. Application of electron backscatter diffraction to grain boundary characterization［J］. International Materials Reviews ,2004,49:1-11．
【5】Humphreys F J. Review grain and subgrain charactersation by electron backscatter diffra-ction［J］. Journal of Science,2001,36:3833-3854．
【6】陈家光,李 忠.电子背散射衍射在材料科学研究中的应用［J］.理化检验-物理分册,2000,36(2):71-77．
【7】Leszek Klimek,Bozena Pietrztk. Electron backscatter deffraction as a useful method for alloys microstructure characterization［J］. Journal of Alloy and Compounds,2004,382:17-23．
【8】Angus J Wilkinson. A new method for determining small Misorientation form electron back scatter diffraction patterns［J］. Scripta Mater,2001,44:2379-2385．
【9】李华清,谢水生.取向成像电子显微术试样的制备［J］.理化检验-物理分册,2004,40(12):612-615．
【10】韩德伟,张建新.金相试样制备与显示技术［M］.广州:中南大学出版社,2005:33．
【11】屠世润,高 越.金相原理与实践［M］.北京:机械工业出版社,1990:60,316．
【2】Adam J S,Mukul K,Brent L A. Electron backscatter diffraction in materials science［M］. New York: Kluwer Academic/Plenum Publishers,2001．
【3】Dingley D J. A comparison of diffraction techniques for SEM［J］. Scanning Electron Micro Sco-py,1981,Ⅳ:273-286．
【4】Randle V. Application of electron backscatter diffraction to grain boundary characterization［J］. International Materials Reviews ,2004,49:1-11．
【5】Humphreys F J. Review grain and subgrain charactersation by electron backscatter diffra-ction［J］. Journal of Science,2001,36:3833-3854．
【6】陈家光,李 忠.电子背散射衍射在材料科学研究中的应用［J］.理化检验-物理分册,2000,36(2):71-77．
【7】Leszek Klimek,Bozena Pietrztk. Electron backscatter deffraction as a useful method for alloys microstructure characterization［J］. Journal of Alloy and Compounds,2004,382:17-23．
【8】Angus J Wilkinson. A new method for determining small Misorientation form electron back scatter diffraction patterns［J］. Scripta Mater,2001,44:2379-2385．
【9】李华清,谢水生.取向成像电子显微术试样的制备［J］.理化检验-物理分册,2004,40(12):612-615．
【10】韩德伟,张建新.金相试样制备与显示技术［M］.广州:中南大学出版社,2005:33．
【11】屠世润,高 越.金相原理与实践［M］.北京:机械工业出版社,1990:60,316．
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