HG-ICP-AES DETERMINATION OF MERCURY LEAD CADMIUM AND CHROMIUM IN ELECTRONIC HARDWARE COMPONENTS
摘 要
电子五金元件样品经酸消解后,样品溶液与氯化亚锡经自制简易氢化物装置混合产生氢化物,与样品溶液一起导入等离子体中,可同时测定汞、铅、镉、铬四元素.氢化物发生大大提高了汞的检测灵敏度,汞、铅、镉、铬检出限分别为0.002,0.006,0.002和0.005 mg·L-1,相对标准偏差为2.09%-3.12%.
Abstract
Samples of electronic hardware components were digested with nitric acid,and the sample solutions obtained were mixed with stannous chloride to perform the hydride generation in the self-made,simple hydride generator.The generated hydrides together with the sample solution were then introduced into the ICP,and Hg,Pb,Cd and Cr were determined simultaneously by AES.Sensitivity of detection of mercury was improved remarkably by the use of hydride generation.Values of detection limits of the elements mentioned above were as follows:0.002 mg·L-1 (for Hg),0.006 mg·L-1 (for Pb),0.002 mg·L-1 (for Cd) and 0.005 mg·L-1 (for Cr).RSD′s of analytical results were found in the range of 2.09%-3.12%.
中图分类号 O657.31
所属栏目 工作简报
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收稿日期 2006/7/18
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备注童玉贵(1975- ),男,福建莆田人,硕士,工程师,主要从事化矿产品、食品中有毒有害物质的检测.
引用该论文: TONG Yu-gui,CHENG Qun,LIN Bi-fen,ZHENG Zhi-ming. HG-ICP-AES DETERMINATION OF MERCURY LEAD CADMIUM AND CHROMIUM IN ELECTRONIC HARDWARE COMPONENTS[J]. Physical Testing and Chemical Analysis part B:Chemical Analysis, 2006, 42(10): 841~842
童玉贵,程群,林碧芬,郑志明. 氢化物发生-等离子发射光谱法同时测定电子五金元件中汞铅镉铬[J]. 理化检验-化学分册, 2006, 42(10): 841~842
被引情况:
【1】朱俐,董慧茹, "同时测定铅、汞、镉分析方法研究进展",理化检验-化学分册 45, 1352-1356(2009)
【2】钟志光,翟翠萍,李承,张震坤,黄伟,谢静,李政军,张少萍,郑建国,朱彬, "电感耦合等离子体原子发射光谱法测定铅锡合金焊料中铅镉铬和汞",理化检验-化学分册 43, 491-494(2007)
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参考文献
【1】SN/T 2004.2-2005,电子电气产品中铅、镉、铬的测定[S].
【2】SN/T 2004.1-2005,电子电气产品中汞的测定[S].
【3】童玉贵,郑志明.氢化物发生-ICP-AES联用测定鳗鱼中的汞[J].检验检疫科学,2003,13(5):46-47.
【2】SN/T 2004.1-2005,电子电气产品中汞的测定[S].
【3】童玉贵,郑志明.氢化物发生-ICP-AES联用测定鳗鱼中的汞[J].检验检疫科学,2003,13(5):46-47.
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