Development and Application of X-ray Powder Diffraction—To Commemorate the Discovery of X-ray Powder Diffraction for One Hundred Years (To be Continued)
摘 要
为了纪念X射线粉末衍射发现一百年,对其一百年来的发展与应用进行了概括和总结。主要包括以下3个方面的内容:决定X射线粉末衍射应用深度和广度的试验设备的发展,特别是高速度电子计算机和高强度光源的作用;X射线粉末衍射研究物质结构的3个方面(多晶聚集态结构、表面与薄膜结构及晶体结构);X射线粉末衍射近年发展的新技术(系列X射线晶体学、原位与极端条件下的粉末衍射、时间分辨粉末衍射、微区粉末衍射、三维X射线衍射显微术、粉末衍射与电子衍射的结合)。
Abstract
To commemorate the discovery of X-ray powder diffraction (XRPD) for one hundred years, the development and application of XRPD during the past one hundred years were summarized sketchily. The contents included three aspects: the progress of the experimental equipments which had great influence on the depth and width of XRPD application, especially the function of high-speed computer and strong X-ray sources; the three aspects of structures researched by XRPD (the structure of polycrystalline aggregations, the structure of surfaces and films, the structure of crystals); new developed technology of XRPD (serial X-ray crystallography, in-situ XRPD and XRPD under extreme condition, time resolution XRPD, XRPD on micro areas, 3D X-ray diffraction microscopy, the cooperation of powder diffraction and electron diffraction).
中图分类号 TG115.22 DOI 10.11973/lhjy-wl201607007
所属栏目 专题讲座
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收稿日期 2016/4/20
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备注马礼敦(1935-),男,教授,主要从事X射线晶体学方面的教学与研究工作
引用该论文: MA Li-dun. Development and Application of X-ray Powder Diffraction—To Commemorate the Discovery of X-ray Powder Diffraction for One Hundred Years (To be Continued)[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2016, 52(7): 461~468
马礼敦. X射线粉末衍射的发展与应用——纪念X射线粉末衍射发现一百年(待续)[J]. 理化检验-物理分册, 2016, 52(7): 461~468
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参考文献
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【2】LAUE M V.Eine quantitative prufung der theorie fur die Interferenzerscheinungen bei Rontgenstrahlen[C]//Mtinchener Sitzungsberichte. Bavarian: Bavarian Academy of Science,1912:363-373.
【3】马礼敦.X射线晶体学的百年辉煌[J].物理学进展,2014,34(2): 47-52.
【4】SCHERRER P.Personal Reminiscences[M]//EWALD P P. Fifty Years of X-ray Diffraction. Utrecht: N V A Oosthoek’s Uitgeversmaatschappij,1962:642-646.
【5】HULL A W. Autobiography[M]//EWALD P P. Fifty years of X-ray diffraction. Utrecht: N V A Oosthoek’s Uitgeversmaatschappij,1962:582-587.
【6】马礼敦.近代X射线多晶体衍射——实验技术与数据分析[M].北京:化学工业出版社,2004:225-241.
【7】马礼敦.同步辐射装置——上海光源及其应用[J].理化检验-物理分册,2009,45(11):717-723.
【8】EMMA P,AKRE R,ARTHUR J,et al.First lasing and operation of an ?倞ngstrom-wavelength free-electron laser[J].Nature Photon,2010,4:641-647.
【9】HATSUI T,GRAAFSMA H.X-ray imaging detectors for synchrotron and XFEL sources[J].IUCrJ,2015,2:371-383.
【10】STRUDER L,EPP S,ROLLES D,et al.Ion imaging spectrometers in a multipurpose chamber for experiments at 4th generation light sources[J].Nuclear Instruments and Methods in Physical Research Section A,2010,614(3):483-496.
【11】POULSENH F.An introduction to three-dimensional X-ray diffraction microscopy[J].Applied Crystallography,2012,45:1084-1097.
【12】RIETVELD H M.Line profiles of neutron powder-diffraction peaks for structure refinement[J].Acta Crystallographica,1967,22:151-152.
【13】RIETVELD H M.A profile refinement method for nuclear and magnetic structures[J].Applied Crystallography,1969,2:65-71.
【14】马礼敦.X射线粉末衍射的新起点——Rietveld全谱拟合[J].物理学进展,1996,16(2):251-271.
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