使用扫描电镜（SEM）、透射电镜（TEM）、拉曼光谱仪（RS）、原子力显微镜（AFM）、X射线衍射仪（XRD）、X射线光电子能谱仪（XPS）以及傅里叶变换红外光谱仪（FTIR）等仪器设备，对3组氧化石墨还原法和物理法制备的石墨烯粉末以及3组化学气相沉淀（CVD）法制备的石墨烯薄膜试样的表面形貌、片层数量、缺陷情况以及官能团等进行了表征。通过试验结果的对比分析发现：SEM在石墨烯表面形貌分析方面最具优势；RS能够很好地测定石墨烯薄膜的片层数量，而对于石墨烯粉末，AFM则更为适用；石墨烯缺陷情况分析方面，RS相比于其他方法具有明显优势，能够对缺陷密度和类型进行计算和判定；XPS不仅能够测试官能团的种类，还能够对其进行定量分析，是石墨烯中官能团表征的有效手段。

The scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy (RS), atomic force microscopy (AFM), X-ray diffractometer (XRD), X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR) and other equipments, were used to characterize the surface morphology, layer number, defect condition and functional group of 3 groups of graphene powder samples prepared by oxidation graphite reduction method and physical method and 3 groups of graphene film samples prepared by chemical vapor deposition (CVD) method. Through the comparative analysis of the test results, it is found that the SEM is most applicative for surface morphology characterization of graphenes. The RS is good at layer number testing of graphene film samples, and AFM is more suitable for graphene powder samples. The RS analysis is the best method for the defect analysis in the graphenes compared with other methods, and through it the defect density can be calculated and the defect type can be determined. The type and content of the functional group in the graphenes can both be determined by XPS analysis which is an effective method for graphene functional group characterization.