Cause Analysis on Small White Spot Defect of B50A800 Non-oriented Silicon Steel Plate
摘 要
某公司生产的B50A800无取向硅钢板在生产过程中表面出现小白点缺陷,采用宏观分析、化学成分分析、硬度测试、扫描电镜及能谱分析等方法对缺陷产生原因进行了分析。结果表明:由于硅钢板生产过程中纯水清洗段清洗不彻底引入了钠元素,涂层段清洗不彻底引入了铬元素,引入的钠元素和铬元素与涂层液中的酸根离子发生反应,生成了微观显示为壳状、宏观显示为小白点的杂质,最终造成了硅钢板表面小白点缺陷的产生。最后提出了相应的改进建议并取得了良好的效果。
Abstract
The small white spot defect was found on the surface of B50A800 non-oriented silicon steel plate produced by a company during the production. The formation reasons of the defect were analyzed by macro analysis, chemical composition analysis, hardness test, scanning electron microscope and energy spectrum analysis and so on. The results show that element sodium was introduced due to the incomplete cleaning during the water cleaning section, and element chromium was introduced due to the incomplete cleaning during the coating section. The introduced sodium element and chromium element reacted with the acid root ions in the coating liquid to form impurities which was microscopically displayed as shell-shape and macroscopically displayed as small white spots, so the small white spot defect was generated on the surface of the silicon steel plate. Finally, corresponding improvement suggestions were put forward and good results were achieved.
中图分类号 TG115.2 DOI 10.11973/lhjy-wl201906016
所属栏目 质量控制与失效分析
基金项目
收稿日期 2018/3/9
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备注韩鹏钧(1980-),男,高级技师,主要从事无取向硅钢板的生产管理工作,hanpenjun@baosteel.com
引用该论文: HAN Pengjun,ZHANG Rongkang,DU Zhixing. Cause Analysis on Small White Spot Defect of B50A800 Non-oriented Silicon Steel Plate[J]. Physical Testing and Chemical Analysis part A:Physical Testing, 2019, 55(6): 430~432
韩鹏钧,张荣康,杜志兴. B50A800无取向硅钢板小白点缺陷成因分析[J]. 理化检验-物理分册, 2019, 55(6): 430~432
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参考文献
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