AgCuV合金导电滑环在进行超声检测时发现有内部缺陷的存在。采用化学成分分析、超声检测、金相检验、扫描电镜及能谱分析等方法对缺陷产生的原因进行了分析。结果表明：AgCuV合金导电滑环经超声检测发现的内部缺陷是裂纹，脆性的含钒第二相与AgCu合金基体的结合力弱并且易碎，在应力集中处产生了微裂纹，微裂纹沿着第二相与基体结合力弱的部位扩展，最终导致AgCuV合金导电滑环内部缺陷的产生。

During the ultrasonic test, the AgCuV alloy conductive slip ring was found to have internal defects. The causes of defects were analyzed by means of chemical composition analysis, ultrasonic test, metallographic examination, scanning electron microscope and energy spectrum analysis. The results show that the internal defects of the AgCuV alloy conductive slip ring were cracks. The brittle second phase with vanadium made the binding force between brittle second phase and AgCu alloy matrix weak, and microcracks appeared at the stress concentration. The microcracks propagated along the part with weak bonding force between the second phase and the matrix, which eventually led to the formation of internal defects in the AgCuV alloy conductive slip ring.