Citation: | GAO Qianwen, LI Yixue, FENG Dan, SHI Xuefang. Preparation of transmission electron microscopy microcolumn samples based on focused ion beam-scanning electron microscopy[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2024, 60(9): 30-33. DOI: 10.11973/lhjy-wl240170 |
By using focused ion beam-scanning electron microscopy to improve the traditional method of transmission electron microscopy sample preparation. By changing the area and effect of ion beam assisted deposition, and improving the U-shaped cut to L-shaped cut, the compressed mouse bone micro-pillars samples were successfully extracted onto a dedicated copper mesh. The extracted sample could be precisely thinned by ion beam, and the direction of collagen fibers could be observed under transmission electron microscopy.
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