Advanced Search
    ZHAO Mei, LI Cheng-dong, SHANG Zhen-hua, SUI Jing. Basic Usage Methods of Olympus CCD Installed in Transmission Electron Microscope[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2014, 50(1): 41-45.
    Citation: ZHAO Mei, LI Cheng-dong, SHANG Zhen-hua, SUI Jing. Basic Usage Methods of Olympus CCD Installed in Transmission Electron Microscope[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2014, 50(1): 41-45.

    Basic Usage Methods of Olympus CCD Installed in Transmission Electron Microscope

    More Information
    • Received Date: February 27, 2013
    • Basic usage methods of Olympus CCD installed in JEM-2100 TEM were explained, including how to observe samples, acquire and save images, set exposure time, select image acquiring style; procedures of subtracting background; objective anastigmat using FFT, turning on and off CCD.
    • [1]
      左演声, 陈文哲, 梁伟. 材料现代分析方法[M].北京: 北京工业大学出版社, 2000.
      [2]
      戎咏华.分析电子显微学导论[M].北京: 高等教育出版社, 2006.
      [3]
      进藤大辅, 及川哲夫.材料评价的分析电子显微方法[M].刘安生,译.北京: 冶金工业出版社, 2001.
      [4]
      郭可信, 叶恒强. 高分辨电子显微学在固体科学中的应用[M].北京: 科学出版社, 1985.
      [5]
      进藤大辅, 平贺贤二.材料评价的高分辨电子显微方法[M].刘安生,译.北京: 冶金工业出版社, 2002.

    Catalog

      Article views (4) PDF downloads (2) Cited by()

      /

      DownLoad:  Full-Size Img  PowerPoint
      Return
      Return