X射线法测量锗单晶的应力

详细信息

GE SINGLE CRYSTAL STRESS MEASUREMENT BY X-RAY METHOD

摘要: 采用Hiroshi Suzuki等人提出的新的单晶应力测量原理,结合不对称布拉格衍射技术,对锗单晶的应力进行了测量。这种方法的优点在于利用多组试验数据求解多元线性回归方程,从而消除了一般单晶应变测定方法中无应变状态下晶面间距不准确对结果所带来的影响。该法可以推广应用于其他单晶体的应力测量和高织构取向材料的X射线应力测量。
- X射线衍射 /
- 锗单晶 /
- 应力 /
- 不对称布拉格衍射
Abstract: The stresses of the Ge single crystal have been measured according to a new principle proposed by Hiroshi SUZUKI and the asymmetrical Bragg diffraction technique. Compared with the conventional methods,the new method can determine the stress by using multiple regression equations. So the effect of the reliability of the stress-free plane spacing can be avoided. The method may be applied to other single crystal materials and high textured orientation materials.
- X-ray diffraction /
- Ge single crystal /
- stress /
- Asymmetrical Bragg diffraction

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